“…X-ray cross-correlation analysis (XCCA), also known as fluctuation X-ray scattering, has been shown to overcome this limitation. Recently, the potential of XCCA has been demonstrated by various theoretical and simulation studies on 2D systems (Altarelli et al, 2010;Kurta et al, 2012;Lehmkü hler et al, 2014;Malmerberg et al, 2015;Latychevskaia et al, 2015;Martin, 2017;Lhermitte et al, 2017) and shown experimentally for thin polymer systems and NPs (Gutt et al, 2014;Schroer et al, 2015;Liu et al, 2017;, liquid crystals (Zaluzhnyy, Kurta, Sulyanova et al, 2017), and colloids and nanocrystals (Mendez et al, 2014;Mancini et al, 2016;Schroer, Westermeier et al, 2016;Mendez et al, 2016;Zaluzhnyy, Kurta, André et al, 2017;Mancini et al, 2018). We previously measured the local orientational order of self-assembled NP films of thicknesses of up to a few micrometres by means of XCCA (Schroer et al, 2015;Lehmkü hler et al, 2018).…”