We have investigated heteroepitaxial films of Sm-doped BiFeO 3 with a Sm-concentration near a morphotropic phase boundary. Our high-resolution synchrotron X-ray diffraction, carried out in a temperature range of 25°C to 700°C, reveals substantial phase coexistence as one changes temperature to crossover from a low-temperature PbZrO 3 -like phase to a high-temperature orthorhombic phase. We also examine changes due to strain for films exhibiting anisotropic misfit between film and substrate. Additionally, thicker films exhibit a substantial volume collapse associated with the structural transition that is suppressed in thinner films.