2009
DOI: 10.1103/physrevb.80.014109
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Structural transitions and complex domain structures across a ferroelectric-to-antiferroelectric phase boundary in epitaxial Sm-dopedBiFeO3thin films

Abstract: We have investigated structural phase transitions across a ferroelectric-to-antiferroelectric phase boundary in epitaxial ͑001͒ oriented Bi ͑1−x͒ Sm x FeO 3 thin films. For the Sm 3+ concentration of 0.1Յ x Յ 0.14, we observe short-range antiparallel cation displacements, verified by the appearance of localized 1 4 ͕011͖ weak reflections in the selected area electron diffraction patterns. At the critical composition of x = 0.14, the system adopts a complex nanoscale domain mixture with appearance of 1 4 ͕011͖,… Show more

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Cited by 174 publications
(153 citation statements)
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“…6 At this critical doping, the film has features of a morphotropic phase boundary ͑MPB͒ solid solution, consisting of a cell-doubled orthorhombic Pnma phase beyond the MPB and a PbZrO 3 ͑PZO͒-like structural phase in local regions below the MPB. [6][7][8] Electron and laboratory x-ray diffraction studies in Ref. 7 show a superlattice peak at 1/2-order along b in pseudocubic notation that appears to be uniquely associated with the orthorhombic phase.…”
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“…6 At this critical doping, the film has features of a morphotropic phase boundary ͑MPB͒ solid solution, consisting of a cell-doubled orthorhombic Pnma phase beyond the MPB and a PbZrO 3 ͑PZO͒-like structural phase in local regions below the MPB. [6][7][8] Electron and laboratory x-ray diffraction studies in Ref. 7 show a superlattice peak at 1/2-order along b in pseudocubic notation that appears to be uniquely associated with the orthorhombic phase.…”
mentioning
confidence: 99%
“…[6][7][8] Electron and laboratory x-ray diffraction studies in Ref. 7 show a superlattice peak at 1/2-order along b in pseudocubic notation that appears to be uniquely associated with the orthorhombic phase. In this same work, high resolution transmission electron microscopy ͑HR-TEM͒ imaging has revealed nanoscale twin domains with a size of 10-20 nm.…”
mentioning
confidence: 99%
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