2009
DOI: 10.3788/aos20092906.1601
|View full text |Cite
|
Sign up to set email alerts
|

Structure and Electro-Optical Property of the Dy3+Doped Lanthanum Zirconate-Titanate Ceramics

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

2011
2011
2015
2015

Publication Types

Select...
4
1

Relationship

0
5

Authors

Journals

citations
Cited by 5 publications
(2 citation statements)
references
References 0 publications
0
2
0
Order By: Relevance
“…These values are comparable with those previously reported for PZT-PZN films. [33][34][35][36][37] The dielectric constant and polarization values for the stack with poly-Si are indicative of 24% improvement compared with the values obtained for the stack without poly-Si. The improvement in the dielectric constant is attributed to reduction of the number of nucleation sites as a result of the poly-Si.…”
Section: Resultsmentioning
confidence: 74%
“…These values are comparable with those previously reported for PZT-PZN films. [33][34][35][36][37] The dielectric constant and polarization values for the stack with poly-Si are indicative of 24% improvement compared with the values obtained for the stack without poly-Si. The improvement in the dielectric constant is attributed to reduction of the number of nucleation sites as a result of the poly-Si.…”
Section: Resultsmentioning
confidence: 74%
“…From the material standpoint, it is well known that the addition of donor dopants or higher valence dopants such as La 3+ , [2][3][4] and Nb 5+ , [5][6][7] to the original piezoelectric material (ABO 3 perovskite structure) contributes electrons when they substitute on the A and B sites, 5,8 improving the energy density of thin-lm piezoelectric materials. 9 We have recently reported the synthesis and integration of a piezoelectric energy harvester based on an alternative material, namely, the relaxor composition 0.9Pb(Zr 0.53 ,Ti 0.47 )O 3 -0.1Pb(Zn 1/3 ,Nb 2/3 )O 3 or PZT-PZN. 10,11 The thin-lm relaxor material was integrated into a cantilever device by a manufacturable, topside, low cost, and planar chemicalwet-etch based process.…”
Section: Introductionmentioning
confidence: 99%