Structure and optical properties of thin titanium films deposited on different substrates

Mahmoud, S.

doi:10.1007/bf01161479

Cited by 14 publications

(8 citation statements)

References 17 publications

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“…S3: Transmisssion vs metal thickness for Al and Ti extracted from Ref. 3 . The dashed line for Al is a linear guide for the eye, while the dashed for Ti is the bulk absorption coefficient from Ref.…”

Section: Optical Transmission Through Metal Contactmentioning

confidence: 99%

Simultaneous Thermoelectric and Optoelectronic Characterization of Individual Nanowires

et al. 2015

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Semiconducting nanowires have been explored for a number of applications in optoelectronics such as photodetectors and solar cells. Currently, there is ample interest in identifying the mechanisms that lead to photoresponse in nanowires in order to improve and optimize performance. However, distinguishing among the different mechanisms, including photovoltaic, photothermoelectric, photoemission, bolometric, and photoconductive, is often difficult using purely optoelectronic measurements. In this work, we present an approach for performing combined and simultaneous thermoelectric and optoelectronic measurements on the same individual nanowire. We apply the approach to GaN/AlGaN core/shell and GaN/AlGaN/GaN core/shell/shell nanowires and demonstrate the photothermoelectric nature of the photocurrent observed at the electrical contacts at zero bias, for above- and below-bandgap illumination. Furthermore, the approach allows for the experimental determination of the temperature rise due to laser illumination, which is often obtained indirectly through modeling. We also show that under bias, both above- and below-bandgap illumination leads to a photoresponse in the channel with signatures of persistent photoconductivity due to photogating. Finally, we reveal the concomitant presence of photothermoelectric and photogating phenomena at the contacts in scanning photocurrent microscopy under bias by using their different temporal response. Our approach is applicable to a broad range of nanomaterials to elucidate their fundamental optoelectronic and thermoelectric properties.

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Section: Optical Transmission Through Metal Contactmentioning

confidence: 99%

Simultaneous Thermoelectric and Optoelectronic Characterization of Individual Nanowires

et al. 2015

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“…This is reasonable as the optical constants of materials in the form of thin films are usually slightly, and often considerably different from those of corresponding bulk materials. [28] In addition, it has been found that the optical properties of evaporated films thicker than 20-30 nm [27] are nearly identical to those of bulk materials. The optical dispersion models used for fitting the dielectric functions of SiO 2 , the Ti layer, and the Au layer are the Cauchy, Lorentz, and Lorentz models, respectively.…”

Section: Resultsmentioning

confidence: 99%

Spectroscopic Ellipsometry Investigation of Au‐Assisted Exfoliated Large‐Area Single‐Crystalline Monolayer MoS₂

Zou

Zhang

et al. 2021

Physica Rapid Research Ltrs

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The recent Au‐assisted mechanical exfoliation technique has enabled scalable fabrication of millimeter‐sized, high‐quality monolayer 2D crystals. Herein, spectroscopic ellipsometry characterization of as‐exfoliated single‐crystalline monolayer MoS2 is reported. By developing layer‐by‐layer ellipsometry measurements and analysis, the complex dielectric function of monolayer MoS2 is extracted. Compared with bulk MoS2, the A and B exciton peaks in the dielectric function spectrum nearly disappear in the 1L MoS2–Au hybrid system. The charge transfer at the 1L MoS2–Au interface is responsible for this observation and the conclusion is also supported by Raman, photoluminescence, and differential reflectance measurements. These results reveal the impact of the Au substrate on the dielectric response of 2D monolayers with strong excitonic effect and will deepen our understanding of the 1L MoS2–Au interaction.

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“…The aim of this work is to examine the influence of the thickness of titanium films (from 12 nm to 1470 nm) formed using the GIMS method on their microstructure, optical and electrical properties. It should be noted that microstructural properties of Ti coatings prepared under different conditions and using various modifications of magnetron sputtering methods are described in literature [2][3][4][5][6][7][18][19][20][21]; however, their optical constants and/or opto-electronic properties are described only in a few publications [20,[22][23][24]. Additionally, the results related to the optical constants of Ti can b found in Reference [12,14,15].…”

Section: Introductionmentioning

confidence: 99%

Optical Properties of Titanium in the Regime of the Limited Light Penetration

Skowroński

2020

Materials

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In this study, the titanium layers from 12 to 1470 nm thick were fabricated by using the method involving dynamically changed working gas pressure (gas injection magnetron sputtering). The influence of the deposition time on the optical and electrical properties of Ti films, as well as on their microstructure, are considered. The samples are investigated by means of spectroscopic ellipsometry, atomic force microscopy, X-ray diffraction, and confocal optical microscopy. Additionally, for the Ti layers, the sheet resistance was determined. The produced coatings exhibit privileged direction of growth (002). The obtained results show a gradual increase in the mean relaxation time of free-carriers with the increase in the thickness of titanium film. However, the plasma energy exhibits maximum for the coating with the thickness of 93 nm. For such thickness, the lowest value of optical resistivity (about 200 μ Ω cm) was observed. It was found that the dc- and optical resistivity exhibit similar values for titanium films with thickness up to 93 nm. For thicker Ti layers, significant differences in resistivities (dc- and optical) were noticed. The behavior of the Drude parameter (the plasma energy), calculated optical resistivity, and discrepancies between values of optical and dc-resistivities for thicker Ti coatings can be explained as a result of the limited light penetration.

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Structure and optical properties of thin titanium films deposited on different substrates

Cited by 14 publications

References 17 publications

Simultaneous Thermoelectric and Optoelectronic Characterization of Individual Nanowires

Simultaneous Thermoelectric and Optoelectronic Characterization of Individual Nanowires

Spectroscopic Ellipsometry Investigation of Au‐Assisted Exfoliated Large‐Area Single‐Crystalline Monolayer MoS₂

Optical Properties of Titanium in the Regime of the Limited Light Penetration

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Structure and optical properties of thin titanium films deposited on different substrates

Cited by 14 publications

References 17 publications

Simultaneous Thermoelectric and Optoelectronic Characterization of Individual Nanowires

Simultaneous Thermoelectric and Optoelectronic Characterization of Individual Nanowires

Spectroscopic Ellipsometry Investigation of Au‐Assisted Exfoliated Large‐Area Single‐Crystalline Monolayer MoS2

Optical Properties of Titanium in the Regime of the Limited Light Penetration

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Spectroscopic Ellipsometry Investigation of Au‐Assisted Exfoliated Large‐Area Single‐Crystalline Monolayer MoS₂