Structure and spectroscopic ellipsometry studies of nanocrystalline Dy2O3 thin films deposited on Al2O3 wafers by electron beam evaporation technique

Alresheedi, Faisal

doi:10.1016/j.jmrt.2021.04.008

Journal of Materials Research and Technology

2021

DOI: 10.1016/j.jmrt.2021.04.008

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Structure and spectroscopic ellipsometry studies of nanocrystalline Dy2O3 thin films deposited on Al2O3 wafers by electron beam evaporation technique

Faisal Alresheedi

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Cited by 10 publications

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Structure and spectroscopic ellipsometry studies of nanocrystalline Dy2O3 thin films deposited on Al2O3 wafers by electron beam evaporation technique

Cited by 10 publications

References 33 publications

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Morphological, Optical, and Electrical Properties of a MOS Capacitor Based on Rare Earth Oxide and p-Porous GaAs

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