2012
DOI: 10.1103/physrevb.86.195401
|View full text |Cite
|
Sign up to set email alerts
|

Structure and zero-dimensional polariton spectrum of natural defects in GaAs/AlAs microcavities

Abstract: We present a correlative study of structural and optical properties of natural defects in planar semiconductor microcavities grown by molecular beam epitaxy, which are showing a localized polariton spectrum as reported in Zajac et al., Phys. Rev. B 85, 165309 (2012). The three-dimensional spatial structure of the defects was studied using combined focussed ion beam (FIB) and scanning electron microscopy (SEM). We find that the defects originate from a local increase of a GaAs layer thickness. Modulation height… Show more

Help me understand this report
View preprint versions

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

1
25
0

Year Published

2014
2014
2017
2017

Publication Types

Select...
6
1

Relationship

0
7

Authors

Journals

citations
Cited by 19 publications
(26 citation statements)
references
References 30 publications
1
25
0
Order By: Relevance
“…The presence of the defect has the effect to modify the effective thickness of the cavity layer, resulting for example in a red-shift of the photonic dispersion inside the defect [24]. As a result, the resonance frequency inside the defect shifts from ω 0 to ω 0 with respect to the bare cavity and accordingly the in-plane wave vector k to k , with k > k (Fig.…”
Section: S5 Theory For the Cavity Mode Scattering By A Circular Defectmentioning
confidence: 99%
See 3 more Smart Citations
“…The presence of the defect has the effect to modify the effective thickness of the cavity layer, resulting for example in a red-shift of the photonic dispersion inside the defect [24]. As a result, the resonance frequency inside the defect shifts from ω 0 to ω 0 with respect to the bare cavity and accordingly the in-plane wave vector k to k , with k > k (Fig.…”
Section: S5 Theory For the Cavity Mode Scattering By A Circular Defectmentioning
confidence: 99%
“…As discussed above, the appearance of the intensity minima and phase dislocations is a result of interference which is sensitive to the intensity and relative phase of contributing waves. The increase of the energy of the excitation beam by 2 meV causes an increase of the in-plane wave vector of the propagating The wave vector dependence of such transitions will depend on the defect structure and the related bound polariton states [24], so that they could also be observed with decreasing wave vector for other defects. Intensity profiles measured at a fixed distance from the defect [Figs.…”
mentioning
confidence: 99%
See 2 more Smart Citations
“…We describe the defect via a potential V d (r) acting on the photonic component; this can either be a defect in the cavity mirror or a localized laser field [25,29,30]. In the conservative, homogeneous, and linear regime [γ X,C = 0 = V d (r) = g X ], the eigenvalues ofĤ are given by the lower (LP) and upper polariton (UP) energies, 2ω…”
Section: Modelmentioning
confidence: 99%