1997
DOI: 10.1109/20.649893
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Structure of nitrogenated carbon overcoats on thin-film hard disks

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Cited by 15 publications
(6 citation statements)
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“…Several studies on carbon nitride layers showed, however, that the low m/z clusters carry highly relevant structural information. Huang et al (1997a;1997b) showed that TOF S-SIMS allowed characterization of carbon nitride overcoats on thin-®lm hard disks. The surface was sputter cleaned with the Ga beam.…”
Section: Elemental Analysis and Inorganic Speciationmentioning
confidence: 99%
“…Several studies on carbon nitride layers showed, however, that the low m/z clusters carry highly relevant structural information. Huang et al (1997a;1997b) showed that TOF S-SIMS allowed characterization of carbon nitride overcoats on thin-®lm hard disks. The surface was sputter cleaned with the Ga beam.…”
Section: Elemental Analysis and Inorganic Speciationmentioning
confidence: 99%
“…Recently, a number of manufacturers of magnetic recording media have replaced the CHx overcoat with an amorphous-nitrogenated carbon (CNx) overcoat. Reports extolling the tribological benefits of CNx have appearedl Most have attributed the apparent improvement in the tribology of CNx overcoats relative to CHx overcoats to the increased hardness of the CNx film. However, altering the nature of the carbon surface could also strongly influence the PFPE lubricant via modifying the adhesive strength, bonding kinetics, lubricant orientation, and/or lubricant mobility.…”
Section: Introductionmentioning
confidence: 99%
“…Because of the small number of gas-phase events, removed particles from the substrate are unlikely to be redeposited on it. 23 The surface roughness data obtained by the scanning probe microscope indicated a smoother film development with increasing H atom % content in the Ar ϩ N 2 ϩ C 2 H 4 gas mixture. Redeposition of these particles is much lower at small deposition pressures.…”
Section: Resultsmentioning
confidence: 94%