2013
DOI: 10.1063/1.4808240
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Structure-stress-resistivity relationship in WTi alloy ultra-thin and thin films prepared by magnetron sputtering

Abstract: WTi thin films were prepared from an alloyed target (W:Ti ∼ 70:30 at. %) by magnetron sputtering. Body-centered cubic WxTi1−x solid solutions with a {110} fiber texture and columnar grains have been produced with 0.75<x<0.81. The sub-stoichiometry of Ti is shown to result from atom transport and, to a lesser extent, from resputtering. The stress-free lattice parameter values of the films are shown to be close to the bulk lattice parameter of α-W. The electrical resistivity of the produced WTi thi… Show more

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Cited by 8 publications
(5 citation statements)
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“…A new paper, which discusses the effect of the impurity and morphology to be given to the resistance in this alloy system (W-rich side range) films appeared recently [5]. The paper presents that the resistivity and surface roughness increase greatly with Ar gas pressures around of 1 Pa.…”
Section: Resultsmentioning
confidence: 97%
See 1 more Smart Citation
“…A new paper, which discusses the effect of the impurity and morphology to be given to the resistance in this alloy system (W-rich side range) films appeared recently [5]. The paper presents that the resistivity and surface roughness increase greatly with Ar gas pressures around of 1 Pa.…”
Section: Resultsmentioning
confidence: 97%
“…Recently, the electrical resistivity of sputtered TiW thin film had been studied by Glebovsky et al [3,4], and Le Priol et al [5], however the thermal coefficient have not been measured. We have prepared the films by using a DC magnetron sputtering system and found a zero TCR (thermal coefficient of resistivity) alloy film in this binary alloy system.…”
mentioning
confidence: 99%
“…It has been understood that the heavier W atoms (183.84 amu) will sputter in a more ballistic manner, which is not the case for Ti atoms (47.867 amu) [37,38]. The Ti atoms are scattered more rapidly due to the gas atoms therefore enhancing energy losses in the Ti deposition flux [38,39].…”
Section: Film Thicknessmentioning
confidence: 97%
“…Furthermore, as discussed under the film thickness variation, the relative differences in the sputtering yield and oxidation also confirms the variation in composition from target to film. In addition, for W-Ti alloy targets, there are several reports that confirm film composition deviations from that of the alloy target due to preferential sputtering and gas phase scattering phenomena [37][38][39]. XPS depth-profiling on the WO 3 -TiO 2 films was performed to determine the film chemistry, and possible changes with depth.…”
Section: Page 14 Of 34mentioning
confidence: 98%
“…Another solid-state method highly useful in welding/cladding different elements cannot be cladded by any other methods [ 43 , 44 , 45 , 46 , 47 , 48 ] and results in a dependable and robust bond. It includes chemical reactions that promote explosive detonations at very high velocity in a controlled manner to force the substrate and the coating together at elevated pressures temperatures [ 49 , 50 ].…”
Section: Literature Studymentioning
confidence: 99%