2015
DOI: 10.1007/s10854-015-3020-5
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Studies on SILAR deposited Cu2O and ZnO films for solar cell applications

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Cited by 18 publications
(6 citation statements)
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“…The dislocation density (δ), defined as the length of dislocation lines per unit volume, was evaluated from the formula (equation (4)) [24]:…”
Section: Structural Characterizationmentioning
confidence: 99%
“…The dislocation density (δ), defined as the length of dislocation lines per unit volume, was evaluated from the formula (equation (4)) [24]:…”
Section: Structural Characterizationmentioning
confidence: 99%
“…the deposition had more crystalline particles. Average value of CZTS thin film crystallite size can be obtained from Debye -Scherrer's equation given in Equation 1 [43,44].…”
Section: Xrd Analysismentioning
confidence: 99%
“…The samples deposited by 75 and 100 cycles have comparatively better crystallite size and lower dislocation density, which leads to reduce grain boundaries. 106 Due to the drop in grain boundary resistance, the photogenerated…”
Section: Number Of Cycles During Depositionmentioning
confidence: 99%
“…In almost all studies, the number of cycles is generally kept constant to understand the other properties of the Cu x O films. There are few investigations where the effect of the number of cycles on the fabrication of Cu x O films 106–110 is discussed, as summarized in Table 7. It is obvious that with the increase of immersion cycles thickness of the films increase.…”
Section: Factors Affecting Silar Deposition Processmentioning
confidence: 99%
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