2008
DOI: 10.1016/j.apsusc.2008.05.345
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Study by EELS and EPES of the stability of InPO4/InP system

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Cited by 10 publications
(5 citation statements)
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“…Here, we present the variation of the ground state energy of SQW with top barrier layer thickness and measure DE v using PL and UPS techniques. Further, it is of necessary interest to investigate the chemical nature of oxides present on the top surface of InAs x P 1À x /InP SQW and their effect on the valence band offset under such conditions [8].…”
Section: Introductionmentioning
confidence: 99%
“…Here, we present the variation of the ground state energy of SQW with top barrier layer thickness and measure DE v using PL and UPS techniques. Further, it is of necessary interest to investigate the chemical nature of oxides present on the top surface of InAs x P 1À x /InP SQW and their effect on the valence band offset under such conditions [8].…”
Section: Introductionmentioning
confidence: 99%
“…According to the pH ranges, two different chemical compositions of InP surface were indeed determined by XPS chemical analyses. Either in acidic pH range [0-4] or basic pH range [8][9][10][11][12][13][14] a chemical composition close to a bare InP surface was determined, while a presence of an oxide/hydroxide mixture was analyzed only in neutral pH range (4,5). Our previous work in liquid ammonia (NH 3 liq.)…”
Section: Introductionmentioning
confidence: 99%
“…To further elucidate other chemical reactions of the intercalated fragments of P 2 O 5 that could take place at graphene-substrate heterointerfaces, we show that this process can also be used to form confined metal phosphates by intercalating P 2 O 5 into a graphene-substrate heterointerface initially containing 2D metals to form indium phosphate as the example in this study (see Methods). Indium phosphate, specifically InPO 4 , is a wide bandgap insulator ( E g = 4.5 eV) with excellent dielectric properties that initially gain interest as a gate material for InP formed via surface oxidation. However, the formation of dimensionally confined indium phosphates remains largely unexplored, thus impending a more comprehensive understanding of their physical properties and potential applications. In our case, we demonstrated the successful formation of confined indium phosphates by intercalating P 2 O 5 into a graphene-SiC heterointerface initially containing confined mono- to bilayer indium also formed by intercalation. , We identified the composition of the confined indium phosphate at the heterointerface by investigating the In and P core-levels using high-resolution XPS (Figure a,b, respectively).…”
Section: Resultsmentioning
confidence: 99%