2015
DOI: 10.1109/jphotov.2015.2463741
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Study of Nickel Silicide Formation and Associated Fill-Factor Loss Analysis for Silicon Solar Cells With Plated Ni-Cu Based Metallization

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Cited by 12 publications
(6 citation statements)
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“…Therefore research was focused on implementation of a diffusion barrier between the copper and the III-V solar cell. Both Ti [20], [21] and Ni [22]- [28] have been proposed as barrier materials for silicon solar cells with Cu contacts. As both Ti and Ni can be easily applied with e-beam evaporation, have a reasonable electrical conductivity and have a decent adhesion with Au, Cu and GaAs, it is interesting to test their diffusion barrier performance for GaAs solar cells as well.…”
Section: Introductionmentioning
confidence: 99%
“…Therefore research was focused on implementation of a diffusion barrier between the copper and the III-V solar cell. Both Ti [20], [21] and Ni [22]- [28] have been proposed as barrier materials for silicon solar cells with Cu contacts. As both Ti and Ni can be easily applied with e-beam evaporation, have a reasonable electrical conductivity and have a decent adhesion with Au, Cu and GaAs, it is interesting to test their diffusion barrier performance for GaAs solar cells as well.…”
Section: Introductionmentioning
confidence: 99%
“…Solar cells produce electricity through the photoelectric effect, where sunlight generates electricity in certain materials by decomposing their external electrons. Mono-crystalline solar cells have played an effective and significant role in the technology of manufacturing silicon solar cells [5] due to their simplicity and advanced technology [6]. Many researchers in the field of manufacturing photovoltaic cells have conducted many researches and studies that improve the manufacturing process at a low cost, and higher efficiency [7][8] .…”
Section: Introductionmentioning
confidence: 99%
“…Among these phases, NiSi has the lowest resistivity and therefore is the preferred phase for contact formation. 18 NiSi is usually formed using a two-step annealing process, which 22 current−voltage measurements, 23,24 and photoluminescence imaging. 25−27 The results from some of these studies that use solution-based Ni deposition are contradictory.…”
Section: Introductionmentioning
confidence: 99%
“…The effectiveness of Ni and NiSi layers as Cu diffusion barriers in c -Si solar cells has been studied using techniques such as suns-open circuit voltage, current–voltage measurements, , and photoluminescence imaging. The results from some of these studies that use solution-based Ni deposition are contradictory. While Bartsch et al have shown that the Ni is an effective barrier for Cu, Flynn et al have shown that Cu readily diffuses through the Ni layer and forms Cu 3 Si precipitates .…”
Section: Introductionmentioning
confidence: 99%