2002
DOI: 10.1063/1.1489094
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Study of self-limiting oxidation of silicon nanoclusters by atomistic simulations

Abstract: We present molecular dynamics simulations directed at understanding self-limiting oxidation of nanoclusters. Atomic oxygen is inserted in an atom-by-atom way in the silicon bonds to form silicon oxide. First, we focus on planar oxidation to calibrate our model and test its capabilities. Then, we present results on oxidation of 50 Å diam silicon spheres. Kinetic causes of self-limitation are investigated by drawing a map of the local stress in the Si/SiO 2 system. We obtain stresses in contrast to in continuum … Show more

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Cited by 58 publications
(42 citation statements)
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“…As the escape depth of the Si 2p photoelectrons at the photon energy used here does not exceed 1 nm ͑well below the mean radius of the NCs if͒, the main contribution to the Si 0 signal should then arise from the disordered Si atoms close to the core/shell interface. The second cause of structural disorder in the NCs is the level of inhomogeneous stress from the core to the oxidized shell surface, as shown by Dalla Torre's calculations 22 on the oxidation of 5 nm diameter Si NCs, in agreement with previous electron microscopy results. 17 The stressed silica shell may have considerable density and therefore structural differences with respect to planar silica.…”
supporting
confidence: 79%
“…As the escape depth of the Si 2p photoelectrons at the photon energy used here does not exceed 1 nm ͑well below the mean radius of the NCs if͒, the main contribution to the Si 0 signal should then arise from the disordered Si atoms close to the core/shell interface. The second cause of structural disorder in the NCs is the level of inhomogeneous stress from the core to the oxidized shell surface, as shown by Dalla Torre's calculations 22 on the oxidation of 5 nm diameter Si NCs, in agreement with previous electron microscopy results. 17 The stressed silica shell may have considerable density and therefore structural differences with respect to planar silica.…”
supporting
confidence: 79%
“…This suggests that the interfacial strain is capable of creating NBOHC in the structure of milled Si nc/SiO 2 systems. Simulation of increasing strain in the interface due to long oxidation hours between the Si nc and SiO 2 matrix has also been demonstrated [11] and this should increase the amount of NBOHC [6]. However, Fig.…”
Section: Methodsmentioning
confidence: 97%
“…The phenomenological model for mass transport in the coated nanoparticle recently proposed by Dalla Torre et al [27] for silicon has been extended here to describe the oxidation of aluminium nanoparticles with a pressure gradient present within the particle.…”
Section: Nature Of Transport Through the Oxide Layermentioning
confidence: 99%
“…where P is the pressure gradient in the particle, V O is the solubility volume of oxygen in aluminium oxide, taken to be 0.02 nm 3 based on work of Dalla Torre et al [27], and T is the temperature of particle. This relation can be thought of as an Einstein's relation for diffusion, D = k B T × v F .…”
Section: Downloaded By [University Of Virginia Charlottesville] At 2mentioning
confidence: 99%