2009
DOI: 10.1016/j.solmat.2009.07.002
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Study of silicon solar cell at different intensities of illumination and wavelengths using impedance spectroscopy

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Cited by 57 publications
(20 citation statements)
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“…1. The values of the series resistances (R s ) obtained from the shift of the impedance curves on the real axis are found quite close to the values (0.4-0.6 O) deduced from the illuminated I-V characteristics and also by using the procedure defined in [7].…”
Section: Resultssupporting
confidence: 80%
“…1. The values of the series resistances (R s ) obtained from the shift of the impedance curves on the real axis are found quite close to the values (0.4-0.6 O) deduced from the illuminated I-V characteristics and also by using the procedure defined in [7].…”
Section: Resultssupporting
confidence: 80%
“…The value of , , and corresponding obtained from the measured impedance spectra under different bias voltage conditions is listed in Table 3. These values are in good agreement with the existing literature for silicon solar cells [33,35].…”
Section: Theory Validation and Characterization Of Lcpv Modulesupporting
confidence: 92%
“…The overall time constant (s IS ) was then calculated as the product R SH C (s), being essentially equal to the value calculated as 1/2pf max . [64][65][66][67][68][69] s was estimated to be 1.8 ms and 0.221 ms for Cell-04 and Cell-05, respectively. The capacitance C (or CPE) derived from the above curve fitting of the Z¢ versus ÀZ¢¢ semicircles in this work is an overall value, without trying to separate the recombination and diffusion terms (i.e., C c and C dl ).…”
Section: Device Propertiesmentioning
confidence: 97%
“…The capacitance C (or CPE) derived from the above curve fitting of the Z¢ versus ÀZ¢¢ semicircles in this work is an overall value, without trying to separate the recombination and diffusion terms (i.e., C c and C dl ). Therefore, R SH C will be referred to simply as the overall time constant; to obtain the minority-carrier lifetime using this method one needs to subtract the junction time constant of R r C c (where R r is the recombination resistance) from this overall time constant s. 64 More details on IS analysis and its applications for different types of solar cells including Si, 66 CdTe, 67,68 Finally, the photogenerated minority-carrier lifetime s was found from the OCVD for low-level photon injection using the relation described elsewhere. 53,75 The s values estimated from the OCVD for SnS solar cells Cell-04 and Cell-05 are shown in Fig.…”
Section: Device Propertiesmentioning
confidence: 99%