Monocrystalline silicon wafers are widely used in photovoltaic industry. The trend towards thinner wafers leads to higher breakage rates in the production process. In this context, the characterization of the mechanical strength becomes necessary. Different fracture tests as the ring/ball on ring are carried out. This paper presents different ways to simulate these tests. Analytical methods are applied in a first step. Simplified FE models (with shell elements and an axisymmetric model) that take into account non linearities existing in the test are presented and a 3d solid model is detailed. Results in terms of calculation time, stress distribution, adjustment to the tests and fitting to a Weibull distribution are compared.