Proceedings of the Tenth International Conference on Civil, Structural and Environmental Engineering Computing
DOI: 10.4203/ccp.81.104
|View full text |Cite
|
Sign up to set email alerts
|

Study of the Brittle Fracture of Monocrystalline Silicon Wafers

Abstract: There is a growing trend towards using thinner wafers in order to reduce the costs of solar energy. But the current tools employed during the solar cells production are not prepared to work with thinner wafers, decreasing the industrial yield due to the high number of wafers broken. To develop new tools, or modify existing ones, the mechanical properties have to be determined. This paper tackles an experimental study of the mechanical properties of wafers. First, the material characteristics are detailed and t… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
4
0
1

Publication Types

Select...
2

Relationship

1
1

Authors

Journals

citations
Cited by 2 publications
(5 citation statements)
references
References 5 publications
0
4
0
1
Order By: Relevance
“…Con el n de comprobar la inuencia de la estructura cristalina en la resistencia ( [5], [7]), se prepararon tres grupos con diferente orientación (Figura Figura 2.16: Fotografía de la supercie texturizada de una oblea monocristalina 2.17). Para ello se partió de tres lingotes crecidos según la dirección 100 y se recticaron dejando los planos {110} a 45 • de los bordes (como las comerciales) a 22,5 • y a 0 • .…”
Section: Inuencia De La Estructura Cristalina En La Resistencia Del S...unclassified
“…Con el n de comprobar la inuencia de la estructura cristalina en la resistencia ( [5], [7]), se prepararon tres grupos con diferente orientación (Figura Figura 2.16: Fotografía de la supercie texturizada de una oblea monocristalina 2.17). Para ello se partió de tres lingotes crecidos según la dirección 100 y se recticaron dejando los planos {110} a 45 • de los bordes (como las comerciales) a 22,5 • y a 0 • .…”
Section: Inuencia De La Estructura Cristalina En La Resistencia Del S...unclassified
“…Moreover, the wire cutting process may origin cracks on the wafer's surfaces. Therefore, the mechanical strength of silicon wafers depends on the cracks population residing in them ( [4], [5], [6]). …”
Section: Figure 2 Silicon Ingot Growth Through the Cz Processmentioning
confidence: 99%
“…This test loads the zone between the lower supports so both types of cracks are stressed. Therefore, results are taking into account cracks in the central zone of the wafer generated by the wire sawing process as well as cracks near the edges generated by the cutting process to make pseudo square cross section wafers ( [6], [9]). This type of test has been employed by the authors in previous studies ( [4], [6]) but it's not concerning to the results that are presented in this paper.…”
Section: Four Line Bending Testmentioning
confidence: 99%
See 2 more Smart Citations