Study of the formation mechanism of bundle structures using AFM tip-based nanoscratching approach

Wang, Jiqiang; Yan, Yongda; Chang, Shunyu; Wang, Tong; Geng, Yanquan; Gan, Yang

doi:10.1016/j.triboint.2019.106000

Cited by 15 publications

(12 citation statements)

References 41 publications

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“…For instance, we have used a simple Gaussian profile for the indentation print, but this profile could be modified by introducing, e.g., pyramidal (Berkovich type) tips. In this context, the importance of tip face orientation has been suggested by recent experiments by Yan et al [11,21].…”

Section: Discussionmentioning

confidence: 88%

Numerical study of pattern formation in compliant surfaces scraped by a rigid tip

2021

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The emergence of surface patterns on the surfaces of compliant materials subject to plowing wear is a complex problem which can be quantitatively characterized, e.g., on polymer surfaces scraped by an atomic force microscope (AFM) tip. Here we explore the applicability of a phenomenological model recently introduced to describe this phenomenon. Based on the competition between the viscoplastic indentation and the elastic shear stress caused by the tip, the model is able to reproduce the wavy features (ripples) observed when the tip is scanned along a series of parallel lines. For low values of the driving velocity v and the spacing b between scan lines, the existence of dotted areas formed by variously oriented pit alignments is observed. Moreover, coexistence of rippled with dotted domains is also observed at suitable parameter values. The formation process of the ripples is also described in detail. The amplitude, period, and orientation of these features are estimated numerically for different values of v and b parameters. We have also revisited the formation of the wavy patterns formed when a single line is scanned, and derived an equation which correctly describes their period and depth, and the static friction as well. This equation is not applicable when several lines are scanned one after the other and the ripples emerge as result of a cooperative process which involves the scanning of several lines.

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Section: Discussionmentioning

confidence: 88%

Numerical study of pattern formation in compliant surfaces scraped by a rigid tip

2021

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“…Another important parameter in the fabrication of ripples is the spacing between successive scan lines, called feed. Wavelength and amplitude decrease with increasing feed (Wang et al, 2020). There is a threshold value of the feed, above which ripples are not formed (Yan et al, 2012).…”

Section: Introductionmentioning

confidence: 96%

Section: Introductionmentioning

confidence: 99%

“…On polymer films, such deformation may engender permanent wear patterns in the form of ripples (or bundles), which are often oriented almost perpendicularly to the fast scan direction (Leung and Goh, 1992). AFMscan-induced ripples have been observed on films of polystyrene (PS) (Leung and Goh, 1992), polyethylene terephthalate (PET) (D'Acunto et al, 2007), poly-ε-caprolactone (PCL) (D'Acunto et al, 2007), polyvinyl acetate (PVA) (Schmidt et al, 2003a), and polycarbonate (PC) (Sun et al, 2012;Yan et al, 2014;Wang et al, 2020). The influence of numerous experimental parameters on the ripple structure has been extensively investigated.…”

Section: Introductionmentioning

confidence: 99%

“…It was found that amplitude (height difference between peak and trough) and wavelength (lateral distance between two successive peaks) of the ripples increase with force, temperature, and number of scans (Schmidt et al, 2003a;Gotsmann et al, 2006;Wang et al, 2020). The dependence on tip velocity is more complex (Wang et al, 2020). The wavelength of the emerging ripples on a polycarbonate surface decreases with increasing velocity up to a threshold value of 100 μm/s, above which it starts to increase.…”

Section: Introductionmentioning

confidence: 99%

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Friction and Mechanical Properties of AFM-Scan-Induced Ripples in Polymer Films

Friedrich

Cappella

2021

Front. Mech. Eng.

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When compliant samples such as polymer films are scanned with an atomic force microscope (AFM) in contact mode, a periodic ripple pattern can be induced on the sample. In the present paper, friction and mechanical properties of such ripple structures on films of polystyrene (PS) and poly-n-(butyl methacrylate) (PnBMA) are investigated. Force volume measurements allow a quantitative analysis of the elastic moduli with nanometer resolution, showing a contrast in mechanical response between bundles and troughs. Additionally, analysis of the lateral cantilever deflection when scanning on pre-machined ripples shows a clear correlation between friction and the sample topography. Those results support the theory of crack propagation and the formation of voids as a mechanism responsible for the formation of ripples. This paper also shows the limits of the presented measuring methods for soft, compliant, and small structures. Special care must be taken to ensure that the analysis is not affected by artefacts.

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A New Method of AFM‐Based Nanolithography Using Frequency Enhanced Electrochemical Pressure Solution Etching

Fraysse

MacLeod

Gates

et al. 2023

Adv Materials Technologies

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A new method of direct‐write nanolithography that is able to rapidly etch silica surfaces under a scanning atomic force microscopy (AFM) probe in tapping mode (TM) is reported. In this lithography technique, silica surfaces are etched using a recently described electro‐chemo‐mechanical phenomenon of frequency enhanced electrochemical pressure solution (FEEPS). In FEEPS, the tapping of the AFM tip generates oscillations of the Stern potential at the silica‐water interface that can accelerate the silica dissolution kinetics by more than 5–6 orders of magnitude when surface resonance states are achieved; i.e., when the oscillation frequency is in phase with the dynamics of interfacial chemical reaction steps. By scanning silica surfaces in TM, silica is selectively dissolved below the tapping tip as it is scanned. The FEEPS accelerated silica dissolution rates can generate etched features with depths of more than 60 nm in a single AFM tip pass. The rate of etching can be controlled easily by varying the scanning rate or by modulating the tapping frequency. This fine control over the silica etching process and because material is removed (dissolved) rather than displaced as with nanoscratching, the FEEPS process lends itself to gray‐scale nanolithography which is demonstrated.

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Study of the formation mechanism of bundle structures using AFM tip-based nanoscratching approach

Cited by 15 publications

References 41 publications

Numerical study of pattern formation in compliant surfaces scraped by a rigid tip

Numerical study of pattern formation in compliant surfaces scraped by a rigid tip

Friction and Mechanical Properties of AFM-Scan-Induced Ripples in Polymer Films

A New Method of AFM‐Based Nanolithography Using Frequency Enhanced Electrochemical Pressure Solution Etching

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