2001
DOI: 10.1016/s0039-6028(00)01059-1
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Study of the growth and stability of ultra-thin films of Au deposited on Si(100) and Si(111)

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Cited by 21 publications
(21 citation statements)
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“…There are quite similar reports so far. Kim et al [20] reported the ratio of Au/Si about 1.5 derived by electron-induced Auger electron spectroscopy. Low energy ion scattering analysis [18] also estimated the Au concentration to be about 60%.…”
Section: Meis Analysismentioning
confidence: 99%
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“…There are quite similar reports so far. Kim et al [20] reported the ratio of Au/Si about 1.5 derived by electron-induced Auger electron spectroscopy. Low energy ion scattering analysis [18] also estimated the Au concentration to be about 60%.…”
Section: Meis Analysismentioning
confidence: 99%
“…Such an intriguing property has attracted much attention in terms of the electronic properties dependent on the size and shape of gold particles [7,8]. For the Au/Si grown at RT, there are tremendous papers on the atomic and electronic structures [1][2][3][4][5][9][10][11][12][13][14][15][16][17][18][19][20]. In spite of such many efforts, the phase and electronic structure together with the kinetic behavior are still debatable issues.…”
Section: Introductionmentioning
confidence: 99%
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“…Moreover, Kim al. [24] proposed a structural model, indicating the arrangement of atoms in the layers as they are deposited. The proposed model shows that at the interface between the deposited material and the substrate, the system Au/Si tends to reach the concentration of a 50-50 of compound Au-Si.…”
Section: Resultsmentioning
confidence: 99%
“…In particular, as a result of the strong interaction between silicon and gold, the mixing diffusion of the two species at the nanoscale level can occur even at room temperature. Such interaction was studied in detail by experimental methods [3][4][5][6][7][8] and attempts of such investigations by computer simulation methods were undertaken [9][10][11][12]. These studies showed the possibility of forming eutectic phases at the boundary between gold and silicon as a result of heating.…”
Section: Introductionmentioning
confidence: 99%