2014
DOI: 10.1039/c4tc00311j
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Study of the influences of molecular planarity and aluminum evaporation rate on the performances of electrical memory devices

Abstract: We achieve different storage types by increasing the rate of evaporation of aluminum for the device based on TPA-BT, which has poor planarity.

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Cited by 53 publications
(48 citation statements)
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“…Recently, researchers had elucidated that partial reduction by introducing the oxygen vacancies in oxides held a chance to enhance their electric conductivity and improve the electrochemical and catalytic performance . For example, annealing in hydrogen atmosphere was reported as an effective way to create oxygen defects for TiO 2 and other oxides . However, this high temperature hydrogen treatment method is not practical for energy application due to the cost and safety issues.…”
Section: Introductionmentioning
confidence: 99%
“…Recently, researchers had elucidated that partial reduction by introducing the oxygen vacancies in oxides held a chance to enhance their electric conductivity and improve the electrochemical and catalytic performance . For example, annealing in hydrogen atmosphere was reported as an effective way to create oxygen defects for TiO 2 and other oxides . However, this high temperature hydrogen treatment method is not practical for energy application due to the cost and safety issues.…”
Section: Introductionmentioning
confidence: 99%
“…With E g values, HOMO and LUMO energy levels can be estimated using onset oxidation potentials for the sample (onset E ox ) in cyclic voltammograms using equations and EHOMO=[]Eox+4.8Eferrocene ELOMO=EHOMO+Eg …”
Section: Resultsmentioning
confidence: 99%
“…The results exhibit flat and smooth surface of the polymer films with low roughness of 0.74, 1.29, 0.80, and 0.76 nm for BTDA‐HBPI‐Fc, BPDA‐HBPI‐Fc, ODPA‐HBPI‐Fc, and BDDE‐HBPI‐Fc, respectively. This faultless surface morphology can not only facilitate the hole injection process, but also prevent the permeation of Al into the film during the vacuum deposition of Al electrode …”
Section: Resultsmentioning
confidence: 99%