2018
DOI: 10.1109/jphotov.2018.2861724
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Study of the Interface in a GaP/Si Heterojunction Solar Cell

Abstract: We have investigated the GaP/Si heterojunction interface for application in silicon heterojunction solar cells. We performed X-ray photoelectron spectroscopy (XPS) on thin layers of GaP grown on Si by metal organic chemical vapor deposition and molecular beam epitaxy. The conduction band offset was determined to be 0.9 ± 0.2 eV, which is significantly higher than predicted by Anderson's rule (0.3 eV). XPS also revealed the presence of Ga-Si bonds at the interface that are likely to be the cause of the observed… Show more

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Cited by 16 publications
(11 citation statements)
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“…Full mitigation of s-shapes was achieved by adjusting the contacts, such as by using a different work function material [110] or by doping the contact layer [58]. Improvements of the FF without fully mitigating the s-shape was achieved by doping either absorber [44], [132] or selective contact materials [131]. Furthermore, decreasing the thickness of passivating [30], charge blocking [100], or buffer layers has been shown to mitigate s-shape I-V curves.…”
Section: Discussionmentioning
confidence: 99%
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“…Full mitigation of s-shapes was achieved by adjusting the contacts, such as by using a different work function material [110] or by doping the contact layer [58]. Improvements of the FF without fully mitigating the s-shape was achieved by doping either absorber [44], [132] or selective contact materials [131]. Furthermore, decreasing the thickness of passivating [30], charge blocking [100], or buffer layers has been shown to mitigate s-shape I-V curves.…”
Section: Discussionmentioning
confidence: 99%
“…Annealing was also found to harm the FF of SHJ solar cells with metal oxide selective contacts in a study performed by Bivour et al [48]. In a study on GaP as selective contact material, s-shaped behavior was observed, which vanished after highly doping the crystalline silicon at the interface [44]. Via X-ray photoelectron spectroscopy and crosssectional scanning Kelvin probe microscopy, a high conduction band offset and subsequently a high charge transport barrier was identified as the culprit [44].…”
Section: B Silicon Heterojunction Solar Cells With Alternative Passimentioning
confidence: 97%
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