2019
DOI: 10.1109/ted.2019.2904110
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Study on Dislocation Annihilation Mechanism of the High-Quality GaN Grown on Sputtered AlN/PSS and Its Application in Green Light-Emitting Diodes

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Cited by 32 publications
(22 citation statements)
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“…However, some GaN would still form small GaN crystals on the cone sidewalls, which may have negative influences on GaN growth [ 13 , 14 ]. In our previous work, we confirmed that small GaN crystals would generate dislocations [ 15 ]. When using metal organic chemical vapor deposition (MOCVD) to grow AlN or GaN NLs, the influences of small GaN crystals become more noteworthy [ 13 , 14 , 16 ].…”
Section: Introductionsupporting
confidence: 73%
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“…However, some GaN would still form small GaN crystals on the cone sidewalls, which may have negative influences on GaN growth [ 13 , 14 ]. In our previous work, we confirmed that small GaN crystals would generate dislocations [ 15 ]. When using metal organic chemical vapor deposition (MOCVD) to grow AlN or GaN NLs, the influences of small GaN crystals become more noteworthy [ 13 , 14 , 16 ].…”
Section: Introductionsupporting
confidence: 73%
“…The size of GaN crystals on the 40 nm sputtered AlON/PSS template increased from 0.54 μm to 0.70 μm by our measurement. It could be inferred that GaN crystals on the 40 nm sputtered AlON/PSS template had more chances to grow, and generated more dislocations [ 15 , 20 , 21 ].…”
Section: Resultsmentioning
confidence: 99%
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“…III-Nitride and related alloys are attractive materials due to their immense potential in optoelectronic applications including the ultraviolet and visible range [ 1 , 2 , 3 , 4 , 5 , 6 , 7 , 8 , 9 ]. The well-known Mg is generally used as p-type dopant for GaN based devices.…”
Section: Introductionmentioning
confidence: 99%