Studying The Topographic and Morphology Structure of CdO:In Thin Films

Abstract

Cadmium oxide thin films was deposited by thermal oxidation method, on glass substrate with the thickness (300 ∓ 10)nm and deposition rate (1.25)nm/sec. The films doped with the (In) with the different ratios(l,2,3)%. The topographic and morphology structures of films are characterized by(XRD), (SEM) and (AFM) techniques. XRD investigation showed all films have polycrystalline structures with the preferred orientation (111) plane. The results of microscopic testing proved that presence the nanostructures and all the films were homogeneous and smooth, with a characteristic nano grain size, by scanning electron microscope (SEM), which show that fact formation of all nanostructures with different shapes and grain size. In addition, the results of atomic force microscope (AFM) show that presence nanostructures and there is effect of In-dopant on the root mean square (RMS) roughness of the films, where it increases while the grain size decreases with the increasing of In-dopant.

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“…From the scanning electron microscopy (SEM) analysis, it is apparent that the shape of CdONPs is nearly spherical in nature (Figure 2(a)). Energy‐dispersive X‐ray spectroscopy (EDAX) analysis is a good analytical technique for the elemental analysis or chemical characterization of an unknown sample [36–39] . Here the amount of elements Cd and O varies periodically along with atom size, and it includes 5.74 % of Cd (maximum) along with 94.26 % of O (maximum).…”

“…Energy-dispersive X-ray spectroscopy (EDAX) analysis is a good analytical technique for the elemental analysis or chemical characterization of an unknown sample. [36][37][38][39] Here the amount of elements Cd and O varies periodically along with atom size, and it includes 5.74 % of Cd (maximum) along with 94.26 % of O (maximum). The EDAX analysis clearly has shown that there are no other elements present in the CdONPs composition (Figure 2(b)).…”