2012
DOI: 10.1007/s10686-012-9298-x
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Sub-electron readout noise in a Skipper CCD fabricated on high resistivity silicon

Abstract: The readout noise for Charge-Coupled Devices (CCDs) has been the main limitation when using these detectors for measuring small amplitude signals. A scientific CCD fabricated on a high-resistivity silicon substrate utilizing a floating gate amplifier with the capability of multiple sampling of the charge signal is described in this paper. The Skipper CCD architecture and its Exp Astron (2012) 34:43-64 advantages for low noise applications are discussed. A technique for obtaining sub-electron readout noise leve… Show more

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Cited by 58 publications
(40 citation statements)
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“…This cycle can be repeated to sample the same charge packet multiple times. A more detailed description of the Skipper output stage can be found in [11].…”
Section: Ccd Detectormentioning
confidence: 99%
“…This cycle can be repeated to sample the same charge packet multiple times. A more detailed description of the Skipper output stage can be found in [11].…”
Section: Ccd Detectormentioning
confidence: 99%
“…The sensitivity gained by developing ultra-sensitive detectors able to probe one or a few electrons in semiconductors (e.g. SuperCDMS [40], DAMIC [41,42]), scintillators, or two-dimensional targets has been studied in the context of sub-GeV DM scattering in [36,[43][44][45][46][47]. Below we study the prospects of such experiments to detect or constrain ALPs and A s. Superconducting targets may probe even lower masses, either by DM scattering [48,49] or DM absorption [50], in the future.…”
Section: Jhep06(2017)087mentioning
confidence: 99%
“…17,18 The single 5.9 keV photon generates about 1600 e-h pairs with a standard deviation of about 14 e-rms. 19 The larger signal charge from a single photon in addition to the small conversion gain variance significantly reduces the required readout noise, and makes the direct detection scheme advantageous for single photon detection, especially for higher frame rates. In fact, several development programs for XFEL imaging detectors have adopted the direct detection scheme.…”
Section: A Fabrication Processmentioning
confidence: 99%