2011
DOI: 10.1088/0256-307x/28/6/067802
|View full text |Cite
|
Sign up to set email alerts
|

Subband Light Emission from Phosphorous-Doped Amorphous Si/SiO 2 Multilayers at Room Temperature

Abstract: Phosphorous-doped hydrogenated amorphous Si/SiO2 multilayer structures are fabricated in a plasma enhanced chemical vapor deposition system. The microstructural and luminescence properties of the samples are characterized after annealing at various temperatures. Under the onset crystallization temperature 800-900 ∘ C, a strong subband infrared light emission in the range 1.1-1.8 𝜇m is observed at room temperature instead of the usually observed visible light emission. This subband infrared emission is gradual… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

0
8
0

Year Published

2012
2012
2021
2021

Publication Types

Select...
6

Relationship

1
5

Authors

Journals

citations
Cited by 15 publications
(8 citation statements)
references
References 26 publications
0
8
0
Order By: Relevance
“…demonstrated that Si microcavities with erbium ion implanted can emit light at 1550 nm which is a good match for the optical telecommunication 26 . Recently, it was reported that the subband light emission can be obtained in impurity-doped Si NCs, which provided a new approach to get the Si-based light emitter with the suitable wavelength 27 28 . However, the further utilization of Si NCs in future optoelectronic devices needs a deep understanding of the doping behaviors and the role of dopants on the electronic structure and optical properties of Si NCs, which has not been fully investigated so far.…”
mentioning
confidence: 99%
“…demonstrated that Si microcavities with erbium ion implanted can emit light at 1550 nm which is a good match for the optical telecommunication 26 . Recently, it was reported that the subband light emission can be obtained in impurity-doped Si NCs, which provided a new approach to get the Si-based light emitter with the suitable wavelength 27 28 . However, the further utilization of Si NCs in future optoelectronic devices needs a deep understanding of the doping behaviors and the role of dopants on the electronic structure and optical properties of Si NCs, which has not been fully investigated so far.…”
mentioning
confidence: 99%
“…For elemental semiconductor NCs such as Si NCs gas‐phase doping has been found to be effective . It has been shown that the structural, electronic, and optical properties of Si NCs can be tuned by doping …”
Section: Introductionmentioning
confidence: 99%
“…Whether the energy levels induced by B (especially B configurations concerned in Figure 4(a)) is radiative or not should be more carefully investigated to evaluate the correctness of Sugimoto et al's proposal. Sun et al have also found pronounced low-energy (∼0.95 eV) light emission from P-doped Si NCs [23]. They believed that the low-energy light emission originated from intrinsic defects in Si NCs.…”
Section: Remarks and Outlooksmentioning
confidence: 97%
“…It is well known that boron (B) and phosphorus (P) are the most widely used p-type and n-type dopants for bulk Si, respectively [10]. This leads to the doping of Si NCs by routinely using B and P [11][12][13][14][15][16][17][18][19][20][21][22][23][24][25][26]. In fact, concerns about unintentionally incorporated B and P in Si NCs appeared shortly after the discovery of efficient room-temperature light emission from porous Si, in which Si NCs were present [27][28][29].…”
Section: Introductionmentioning
confidence: 99%