1998
DOI: 10.1007/bf02321262
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Submicron deformation field measurements: Part 1. Developing a digital scanning tunneling microscope

Abstract: ABSTRACT--A new experimental method has been developed for studying deformations of micromechanical material systems at the submicron scale. To that end, a special digital scanning tunneling microscope (STM) was designed to be coupled to a mechanically deforming specimen. Operating in constant current mode, this digitally controlled STM records detailed topographies of specimen surfaces with a resolution of 10 nm in-plane and 7 nm out-of-plane over a 10 lax 10 ~t area. Three-dimensional displacement field info… Show more

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Cited by 49 publications
(25 citation statements)
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“…It is possible, however, to circumvent the involvement of eq (12) in an excellent approximation, l o To this end, consider the components ofeq (12) as derived from eqs (8) and (9) and given by…”
Section: Vvc(p) = \mentioning
confidence: 99%
“…It is possible, however, to circumvent the involvement of eq (12) in an excellent approximation, l o To this end, consider the components ofeq (12) as derived from eqs (8) and (9) and given by…”
Section: Vvc(p) = \mentioning
confidence: 99%
“…The Newton-Raphson 11 method is used to solve for the roots of eq (6). This method uses an approximate value for the root of a function, then iterates until it converges to the actual roots.…”
Section: Spesmentioning
confidence: 99%
“…Because the basic principles of DIC algorithm have been fully described in literature, the algorithm is described here only briefly for clarity. [37][38][39] DIC generally employs a zeromean normalized sum-of-square difference (ZNSSD) criterion to compute the similarity in pixel intensity between reference and deformed image subsets. [40] In this manner, displacements with pixel accuracy are obtained.…”
Section: Digital Image Correlation Of Shpb Resultsmentioning
confidence: 99%