Digest of Technical Papers. 11th IEEE International Pulsed Power Conference (Cat. No.97CH36127)
DOI: 10.1109/ppc.1997.674630
|View full text |Cite
|
Sign up to set email alerts
|

Subnanosecond front, high-voltage generator based on a combined pulsed forming line

Abstract: Nonsymnnetric pulsed double forming line is proposed to shorten the high voltage pulse rise time of the nanosecond generator up to <1 ns. The rate of rise twofold increasinlg has been obtained by the short DFL energy store, mounted in single line output of nanosecond driver without any additional peaking spark gap.High volta e pulse modulators are the basic elements of coherent microwave pulse generators and RF-band ultra wide band videopulse sources2. These devices form the accelerating vollage pulses on the … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Publication Types

Select...
5
1

Relationship

0
6

Authors

Journals

citations
Cited by 7 publications
(2 citation statements)
references
References 3 publications
0
2
0
Order By: Relevance
“…A RADAN 303A high voltage pulser [12] with pulse slicer SN4 providing pulse amplitudes between 20 and 150 kV into matched load, minimum risetime 150 ps, pulse durations 250 -1500 ps, nominal impedance 45 Ω , is connected to a spark gap in a vacuum chamber (pressure between 10 -5 and 600 torr) via a 2 m oil-filled coaxial 45-Ω-line, see Fig. 1.…”
Section: Methodsmentioning
confidence: 99%
“…A RADAN 303A high voltage pulser [12] with pulse slicer SN4 providing pulse amplitudes between 20 and 150 kV into matched load, minimum risetime 150 ps, pulse durations 250 -1500 ps, nominal impedance 45 Ω , is connected to a spark gap in a vacuum chamber (pressure between 10 -5 and 600 torr) via a 2 m oil-filled coaxial 45-Ω-line, see Fig. 1.…”
Section: Methodsmentioning
confidence: 99%
“…The recent availability of high-voltage pulsers reaching into the several 100 kV regime with risetimes of less than 300 ps [13,14], and of transient digitizers with risetimes down to 100 ps enables exploration of breakdown at higher voltages and shorter pulse risetimes than several years ago. A crucial element is the application of a high voltage pulse to a test gap, with the goal to minimize risetime limitations due to capacitance and changes in geometry.…”
Section: Introductionmentioning
confidence: 99%