2021
DOI: 10.1016/j.apsusc.2021.149303
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Substrate-mediated growth of oriented, vertically aligned MoS2 nanosheets on vicinal and on-axis SiC substrates

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Cited by 15 publications
(7 citation statements)
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“…Although the results from the Mo 3d and EXAFS core levels of the amorphous phases are mutually supportive, the S 2p analysis provides the missing information on the sulfur arrangement. Analysis of the S 2p core-level spectra identified three doublets contributions in both amorphous phases, namely S­(-II) in the 1T′-like phase (green) with E B (2p 3/2 ) = 161.62 eV, , S­(-II) in the 2H-like phase (orange) with E B (2p 3/2 ) = 162.24 eV, and S n (-II) with E B (2p 3/2 ) = 162–164 eV assigned to polysulfides with a variable number of sulfur atoms in the chain . At first glance, amorphous MoS 4 contains more S–S bonds than amorphous MoS 2 .…”
Section: Resultsmentioning
confidence: 99%
“…Although the results from the Mo 3d and EXAFS core levels of the amorphous phases are mutually supportive, the S 2p analysis provides the missing information on the sulfur arrangement. Analysis of the S 2p core-level spectra identified three doublets contributions in both amorphous phases, namely S­(-II) in the 1T′-like phase (green) with E B (2p 3/2 ) = 161.62 eV, , S­(-II) in the 2H-like phase (orange) with E B (2p 3/2 ) = 162.24 eV, and S n (-II) with E B (2p 3/2 ) = 162–164 eV assigned to polysulfides with a variable number of sulfur atoms in the chain . At first glance, amorphous MoS 4 contains more S–S bonds than amorphous MoS 2 .…”
Section: Resultsmentioning
confidence: 99%
“…The higher is the intensity of A 1g , the more is the freedom in out‐of‐plane vibration, which means the MoS 2 is vertically standing. [ 33 ] Here, the A 1g / E 1 2g intensity ratio is 1.9 revealing the existence of standing MoS 2 sheets on MoS 2 /NPG‐280. [ 67 ]…”
Section: Resultsmentioning
confidence: 99%
“…[27] CVD starting from MoO 3 and S precursors can be used to grow high-quality MoS 2 heterostructures on several substrates in a scalable way. [9,[28][29][30][31][32][33] Controlling the size, shape, and number of layers of MoS 2 is possible by changing the growth parameters of the CVD reactor; [34] however, the growth depends critically on the interaction with the substrate and a full understanding of this process is still lacking.…”
Section: Introductionmentioning
confidence: 99%
“…[ 17 ] Highly crystalline few layers MoS 2 on 6H‐SiC(0001) have been also obtained by PLD at a substrate temperature of 700 °C. [ 21 ] Furthermore, inhomogeneous MoS 2 flakes with dendritic shape, [ 25 ] or vertically standing triangular MoS 2 domains with respect to the basal planes of 6H‐SiC [ 26 ] and 4H‐SiC [ 27 ] have been obtained by CVD properly tailoring the growth conditions. While vertically standing MoS 2 exposing edges can be interesting for catalysis and hydrogen evolution reaction (HER) applications, [ 27 ] layered MoS 2 films uniformly covering the SiC(0001) basal plane are highly attractive as building blocks of heterojunction devices exploiting vertical current transport at MoS 2 /SiC interfaces.…”
Section: Introductionmentioning
confidence: 99%
“…[ 21 ] Furthermore, inhomogeneous MoS 2 flakes with dendritic shape, [ 25 ] or vertically standing triangular MoS 2 domains with respect to the basal planes of 6H‐SiC [ 26 ] and 4H‐SiC [ 27 ] have been obtained by CVD properly tailoring the growth conditions. While vertically standing MoS 2 exposing edges can be interesting for catalysis and hydrogen evolution reaction (HER) applications, [ 27 ] layered MoS 2 films uniformly covering the SiC(0001) basal plane are highly attractive as building blocks of heterojunction devices exploiting vertical current transport at MoS 2 /SiC interfaces. These can find application both in the state‐of‐the‐art 4H‐SiC technology (Schottky and Junction Barrier Schottky diodes) for energy‐efficient power conversion, [ 28 ] as well as for the implementation of novel device concepts for ultra‐fast switching, including p + ‐MoS 2 /n + ‐SiC Esaki diodes [ 29 ] and vertical hot electron transistors with a n‐MoS 2 base [ 30,31 ] and n + ‐SiC emitter.…”
Section: Introductionmentioning
confidence: 99%