2010
DOI: 10.1016/j.jcrysgro.2010.03.026
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Subtle interplay between polytypism and preferred growth direction alignment in GaN nanorods non-catalytically grown on Si(111) substrates by using hydride vapor phase epitaxy

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Cited by 5 publications
(4 citation statements)
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“…The peaks at 2θ = 35.5°, 2θ = 39.1° and 2θ = 58.9° are related to the silicon substrate. This XRD analysis is in full agreement with the state-of-the-art: (i) GaN NRs with hexagonal cross section have been previously grown along c-direction through patterned SiN x layer deposited on c-plane sapphire templates by MOVPE; (ii) vertical GaN NRs preferentially oriented in the c-direction were grown directly on c-plane sapphire substrate by HVPE , and measured by synchrotron X-ray beam; (iii) (0002), (11̅00) and (112̅0) peaks were reported by HRXRD measurements on GaN NRs synthesized on r-plan sapphire substrate by combining MBE and MOVPE; (iv) (0002), (101̅0), (112̅0), (101̅3) and (202̅1) peaks were detected by XRD measurements on GaN NRs grown by Au-assisted CVD …”
Section: Resultssupporting
confidence: 82%
“…The peaks at 2θ = 35.5°, 2θ = 39.1° and 2θ = 58.9° are related to the silicon substrate. This XRD analysis is in full agreement with the state-of-the-art: (i) GaN NRs with hexagonal cross section have been previously grown along c-direction through patterned SiN x layer deposited on c-plane sapphire templates by MOVPE; (ii) vertical GaN NRs preferentially oriented in the c-direction were grown directly on c-plane sapphire substrate by HVPE , and measured by synchrotron X-ray beam; (iii) (0002), (11̅00) and (112̅0) peaks were reported by HRXRD measurements on GaN NRs synthesized on r-plan sapphire substrate by combining MBE and MOVPE; (iv) (0002), (101̅0), (112̅0), (101̅3) and (202̅1) peaks were detected by XRD measurements on GaN NRs grown by Au-assisted CVD …”
Section: Resultssupporting
confidence: 82%
“…In addition, a two-dimensional (2D) detector simultaneously captures diffracted photons over a wide range of angles, providing a reciprocal space structure of the sample with single data acquisition . Importantly, varying the azimuthal angle by rotating the sample can reveal the multiple heteroepitaxial relationships existing between the grown nanostructure and the substrate. …”
Section: Introductionmentioning
confidence: 99%
“…Only a few investigations have reported the growth of GaN NWs by VLS-HVPE [17][18][19] with chloride precursors, and all of them used low temperature (650-750 • C) experimental conditions. The catalyst-free HVPE growth of 1D GaN has been reported elsewhere, but the 1D structures are short (1-3 µm long) and their aspect ratio is relatively small (<10) [20][21][22]. No systematic studies of the two basic parameters, the V/III ratio and the growth temperature, have been published.…”
Section: Introductionmentioning
confidence: 99%