1997
DOI: 10.1007/s003390050621
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Sulfur-modified surface of InP(001): Evidence for sulfur incorporation and surface oxidation

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Cited by 27 publications
(30 citation statements)
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“…Preferential bonding of sulfur atoms to the surface indium atoms has been observed in several photoemission studies of sulfur species on InP(110) and InP(001) surfaces, [12][13][14] and surface-sensitive core and valence level photoemission measurement of several alkanethiols on III-V(110) also support the thesis of S-In(Ga) bonding. 17 Thus, structural constraints by the substrates will be imposed by the different In-In (Ga-Ga) distances in the surface, which provide the links to the adsorbed thiols.…”
Section: Resultssupporting
confidence: 53%
See 1 more Smart Citation
“…Preferential bonding of sulfur atoms to the surface indium atoms has been observed in several photoemission studies of sulfur species on InP(110) and InP(001) surfaces, [12][13][14] and surface-sensitive core and valence level photoemission measurement of several alkanethiols on III-V(110) also support the thesis of S-In(Ga) bonding. 17 Thus, structural constraints by the substrates will be imposed by the different In-In (Ga-Ga) distances in the surface, which provide the links to the adsorbed thiols.…”
Section: Resultssupporting
confidence: 53%
“…8 This lack of knowledge is also in contrast to the large body of investigations, which dealt with modification of semiconductor surfaces using inorganic sulfur compounds. [12][13][14][15][16] Reports have been given on the influence of alkanethiols on Schottky barrier heights on metal-semiconductor contacts and on passivating properties of adsorbed thiols on semiconductor surfaces. Recently, we have demonstrated that adsorbed alkanethiols form self-assembling layers on (110) surfaces of III-V semiconductors like InP, as well.…”
Section: Introductionmentioning
confidence: 99%
“…17 This sulfur-terminated top surface of the p-InP reduces the surface states and thus the carrier trap density at the inorganic/organic interface, facilitating the hole injection from the semiconductor layer to organic layer. It was reported that the surface Fermi level of an ͑NH 4 ͒ 2 S passivated p-InP is 0.2 eV higher than that of a clean p-InP sample, 18 which reduces the interfacial energetic barrier height for holes. This further improves the hole injection across the inorganic/organic interface.…”
mentioning
confidence: 99%
“…[11][12][13][14] In this study the influence of a (NH 4 ) 2 S passivation step after wet chemical treatments is investigated by SRPES. The various surface components of an as-received substrate will be discussed and will help to understand the effects of different ex-situ wet chemical treatments.…”
mentioning
confidence: 99%