2014
DOI: 10.1109/tmtt.2014.2354592
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Sum Rules for Parallel-Plate Waveguides: Experimental Results and Theory

Abstract: An experimental approach to verify the forward scattering sum rule for periodic structures is presented. This approach allows an upper bound on the total cross section integrated over a bandwidth from a simple static problem to be found. Based on energy conservation, the optical theorem is used to construct a relation between the total cross section and the forward scattering of periodic structures as well as single scatterers inside a parallel plate waveguide. Dynamic measurements are performed using a parall… Show more

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Cited by 7 publications
(10 citation statements)
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“…There are several techniques for characterizing dielectric material properties, such as relative permittivity and loss tangent, at the RF and microwave spectrum. In recent years, a lot of research activities have been aiming at improving the accuracy and sensitivity of material characterization, especially at frequencies below 50 GHz [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17]. However, very few contributions attempt to characterize dielectric and semiconductor materials at the millimeter-wave and THz frequency bands [18][19][20][21][22], [27], which are becoming increasingly important in various applications in sciences and engineering.…”
Section: Introductionmentioning
confidence: 99%
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“…There are several techniques for characterizing dielectric material properties, such as relative permittivity and loss tangent, at the RF and microwave spectrum. In recent years, a lot of research activities have been aiming at improving the accuracy and sensitivity of material characterization, especially at frequencies below 50 GHz [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17]. However, very few contributions attempt to characterize dielectric and semiconductor materials at the millimeter-wave and THz frequency bands [18][19][20][21][22], [27], which are becoming increasingly important in various applications in sciences and engineering.…”
Section: Introductionmentioning
confidence: 99%
“…However, very few contributions attempt to characterize dielectric and semiconductor materials at the millimeter-wave and THz frequency bands [18][19][20][21][22], [27], which are becoming increasingly important in various applications in sciences and engineering. Even so, there are currently only six commercial material characterization techniques available to date [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17] and only two of which are suitable at the frequencies above 50 GHz.…”
Section: Introductionmentioning
confidence: 99%
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“…Convex optimization [31] can be used by representing the data by triangular pulses and based on (7) to identify the most similar Hergoltz function to the measured values. The details of the optimization steps are explained in [32]. The optimization problem is expressed as minimize subject to (8) where…”
Section: Broadband Materials Characterizationmentioning
confidence: 99%
“…The condition of passivity implies, among other things, that the system also has to be causal [8]. Furthermore, the integral representation formula for symmetric Herglotz functions leads to integral identities or sum rules [4,6] that are useful to derive physical bounds in a variety of technical applications such as radar absorbers [9], passive metamaterials [10], high-impedance surfaces [11], antennas [12,13], reflection coefficients [14], waveguides [15] and periodic structures [16], only to mention a few. The integral representation formula can also be used in a convex optimization setting to construct an optimal approximating passive realization of a desired target response [17,18], which is typically given on a finite closed interval of the real (frequency) axis.…”
Section: Introductionmentioning
confidence: 99%