2020 IEEE 29th Asian Test Symposium (ATS) 2020
DOI: 10.1109/ats49688.2020.9301550
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Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing of Multiple Operational Amplifiers

Gaku Ogihara
1
,
Takayuki Nakatani
2
,
Akemi Hatta
3
et al.
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High Precision Measurement of Sub-Nano Ampere Current in ATE Environment

Sato
1
,
Nakatani2,
Ishida
3
et al. 2021
2021 IEEE 30th Asian Test Symposium (ATS)
1
0
0
0
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High Precision Measurement of Sub-Nano Ampere Current in ATE Environment

Sato
1
,
Nakatani2,
Ishida
3
et al. 2021
2021 IEEE 30th Asian Test Symposium (ATS)
1
0
0
0
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Evaluation of High-Precision Nano-Ampere Current Measurement Method for Mass Production

Ogihara
1
,
Nakatani
2
,
Iimori
3
et al. 2021
2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS)
2
0
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Summing Node and False Summing Node Methods: Accurate Operational Amplifier AC Characteristics Testing without Audio Analyzer

Iimori
1
,
Nakatani
2
,
Katayama
3
et al. 2021
2021 IEEE International Test Conference (ITC)
1
0
0
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