2014
DOI: 10.7567/jjap.53.08ne03
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Superior bipolar resistive switching behaviors of solution-processed HfAlOxthin film for nonvolatile memory applications

Abstract: We report on the bipolar resistive switching behavior and uniform cumulative distribution of set/reset voltage observed from the resistive random access memory (ReRAM) device based on a solution-processed HfAlO x thin film. The HfAlO x thin film was spin-coated from a mixture of HfO x and AlO x solutions at 1 : 1 ratio. The dominant conduction mechanism of a solution-processed HfAlO x thin film is found to be the ohmic behavior in the low-resistance state (LRS) and high-resistance state (HRS) in the low-voltag… Show more

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Cited by 6 publications
(2 citation statements)
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References 32 publications
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“…[235] However, for certain active metals such as Al, a thick interfacial layer of oxide (AlO x ) can form on both electrodes, which leads to significant degradation during resistive switching operation by affecting the resistive switching layer's stoichiometry. [171] Asymmetrical devices are composed by two different electrodes and can have inert-inert (e.g., Pt-Au [265] ), inert-active (e.g., Pt-Al, [80] Pt-Ti, [266] Au-Al, [197] Pt-Ag, [87] Au-Ag, [156] and TaN-Cu [226] ), or (noninert)-active (e.g., Cu-Al, [177] Cu-Ag, [199] Ti-Cu, W-Al, [267] LNO-Al, [149] FTO-Ti, [73] FTO-Al, [201] ATO-Cu, [143] ITO-Ag, [192] ITO-Al, [148] and ITO-Ti [81] ) electrode structures. Figure 14 shows the reported metal oxide S-RRAMs with different configurations, symmetric and asymmetric structures.…”
Section: Influence Of the Electrodes/metal Oxide Interfacementioning
confidence: 99%
“…[235] However, for certain active metals such as Al, a thick interfacial layer of oxide (AlO x ) can form on both electrodes, which leads to significant degradation during resistive switching operation by affecting the resistive switching layer's stoichiometry. [171] Asymmetrical devices are composed by two different electrodes and can have inert-inert (e.g., Pt-Au [265] ), inert-active (e.g., Pt-Al, [80] Pt-Ti, [266] Au-Al, [197] Pt-Ag, [87] Au-Ag, [156] and TaN-Cu [226] ), or (noninert)-active (e.g., Cu-Al, [177] Cu-Ag, [199] Ti-Cu, W-Al, [267] LNO-Al, [149] FTO-Ti, [73] FTO-Al, [201] ATO-Cu, [143] ITO-Ag, [192] ITO-Al, [148] and ITO-Ti [81] ) electrode structures. Figure 14 shows the reported metal oxide S-RRAMs with different configurations, symmetric and asymmetric structures.…”
Section: Influence Of the Electrodes/metal Oxide Interfacementioning
confidence: 99%
“…2 Moreover, these techniques are typically slow and need high thermal budget, which can increase fabrication costs. 3 Thus, developing a simple and cost-effective processing method is crucially essential for further progress toward large-scale manufacture of electronic devices.…”
Section: Introductionmentioning
confidence: 99%