“…[235] However, for certain active metals such as Al, a thick interfacial layer of oxide (AlO x ) can form on both electrodes, which leads to significant degradation during resistive switching operation by affecting the resistive switching layer's stoichiometry. [171] Asymmetrical devices are composed by two different electrodes and can have inert-inert (e.g., Pt-Au [265] ), inert-active (e.g., Pt-Al, [80] Pt-Ti, [266] Au-Al, [197] Pt-Ag, [87] Au-Ag, [156] and TaN-Cu [226] ), or (noninert)-active (e.g., Cu-Al, [177] Cu-Ag, [199] Ti-Cu, W-Al, [267] LNO-Al, [149] FTO-Ti, [73] FTO-Al, [201] ATO-Cu, [143] ITO-Ag, [192] ITO-Al, [148] and ITO-Ti [81] ) electrode structures. Figure 14 shows the reported metal oxide S-RRAMs with different configurations, symmetric and asymmetric structures.…”