1995
DOI: 10.1103/physrevb.51.5311
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Surface and size effects on ferroelectric films with domain structures

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Cited by 118 publications
(57 citation statements)
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“…The critical temperature t c is inversely proportional to a f , exactly as was found numerically in [16]. In the strong coupling regime, below a certain critical thickness (Λ < 5) the domain structure abruptly disappears.…”
supporting
confidence: 78%
“…The critical temperature t c is inversely proportional to a f , exactly as was found numerically in [16]. In the strong coupling regime, below a certain critical thickness (Λ < 5) the domain structure abruptly disappears.…”
supporting
confidence: 78%
“…[1][2][3][4] This thickness dependence is more pronounced in epitaxially grown thin films. Funakubo and co-workers 3 experimentally demonstrated that the lattice parameters and dielectric susceptibilities of epitaxially grown PbTiO 3 thin films were increasingly dependent on the film thickness with decreasing total thickness.…”
Section: ͓S0003-6951͑99͒05546-1͔mentioning
confidence: 87%
“…Since analytical solutions to the Euler-Lagrange equations are barely possible even in one-dimensional cases, numerical calculations have been performed to obtain the results for most cases. [12][13][14] For simplicity, most studies of ferroelectric thin films based on the Landau-Devonshire theory involve only one polarization component, which is perpendicular 9,12,[15][16][17] or parallel 13 to the surface of a thin film. The uniaxial polarization simplification is not able to describe three-dimensional polarization states in thin films.…”
Section: Introductionmentioning
confidence: 99%