2003
DOI: 10.1002/sia.1584
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Surface characterization and depth profile analysis of glasses by r.f. GDOES

Abstract: The characterization of surfaces, interfaces and interphases in glasses is analytically challenging and may benefit from recent developments in radiofrequency glow discharge optical emission spectroscopy (r.f. GDOES) applied to non-conductive materials. Thus, the main thrust of this study is to evaluate the potential of r.f. GDOES for the characterization of glass surfaces, physical heterogeneities such as discrete layers and continuous interphases and the distribution of elements in glass materials. Model gla… Show more

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Cited by 16 publications
(10 citation statements)
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“…The technique is dedicated for thin film analysis and helps in determining the chemical gradient composition from the surface to the bulk and -if the ablation rate can be estimated - to precise the thickness of the different layers of the nanocomposite materials [29]. …”
Section: Methodsmentioning
confidence: 99%
“…The technique is dedicated for thin film analysis and helps in determining the chemical gradient composition from the surface to the bulk and -if the ablation rate can be estimated - to precise the thickness of the different layers of the nanocomposite materials [29]. …”
Section: Methodsmentioning
confidence: 99%
“…at the surface. Its occurrence has been interpreted as contamination by carbon deposition at the surface, also by the presence of oil mist from the glow discharge vacuum pumps or by contamination of the anode . Its presence can affect the determination of the carbon concentration for short sputtering times.…”
Section: Resultsmentioning
confidence: 99%
“…Its occurrence has been interpreted as contamination by carbon deposition at the surface, also by the presence of oil mist from the glow discharge vacuum pumps or by contamination of the anode. [20,35] Its presence can affect the determination of the carbon concentration for short sputtering times. The calibration measurements are typically averaged over a 10-s period after an initial pre-burn time during which the signal is not recorded.…”
Section: Glow Discharge Optical Emission Spectroscopy Calibrationmentioning
confidence: 99%
“…The spectral wavelengths (nm) employed for detecting various elements were as follows: H, 121.57; C, 156.14; N, 149.26; Ti, 365.35; and O, 130.00. 12,13) The sputtering time was converted directly to the depth, assuming that the sputtering rate was constant throughout the analysis of the PEG-electrodeposited layer and titanium substrate. Table 2 shows the thicknesses of the PEG deposition layers determined by ellipsometry.…”
Section: Gd-oesmentioning
confidence: 99%