“…This parameter is often characterized in terms of surface pressure-area ( ) A π − isotherms (Frew and Nelson, 1992), equivalently, in terms of the dependence of the surface tension on the concentration of the surface active substances or the local thickness of the film. Research towards quantification of various properties of natural surface films had already started in the 1960s (Jarvis et al, 1967). The results reflect, among other features, the dependence of the elasticity of the film on the chemical properties of the film (Barger et al, 1974), concentration of organic substances in the subsurface microlayer (Frew and Nelson, 1992), and on the wind speed (Hühnerfuss et al, 1977), as well as hysteresis phenomena , elasticity (Demin et al, 1985), stress-relaxation analysis (Pogorzelski and Kogut, 2001), the analysis of the decay of ripples owing to the presence of various films (Ermakov et al, 1986), and methods of evaluation of ripple wave parameters (Fernandez et al, 1992).…”