2020
DOI: 10.1063/5.0010813
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Surface control and MBE growth diagram for homoepitaxy on single-crystal AlN substrates

Abstract: The evolution of surface morphology for single-crystal bulk Al-polar aluminum nitride substrates during ex situ cleaning, in situ cleaning, and subsequent homoepitaxy is investigated. Ex situ acid treatment is found to reveal atomic steps on the bulk AlN substrates. After in situ Al-assisted cleaning at high temperatures in a high vacuum environment monitored with reflection high-energy electron diffraction, cleaner atomic step edges are observed. Subsequent growth on the cleaned bulk AlN by molecular beam epi… Show more

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Cited by 35 publications
(24 citation statements)
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“…This morphology with parallel straight atomic steps has been observed for the layers of binary and ternary (AlGa)N compounds, as well as in related heterostructures grown using both metal organic chemical vapor deposition (MOCVD) and plasma-assisted molecular beam epitaxy (PAMBE). [28,29] However, commercially these substrates cannot compete with cheap sapphire substrates commonly used for III-nitrides. In addition, AlGaN-based devices have a number of problems (point defects, quantumconfined Stark effect [QCSE], and transverse electric [TE]/ transverse magnetic [TM] polarization switching, described later) that cannot be completely solved even by the use of bulk AlN substrates.…”
Section: High Density Of Extended and Point Defectsmentioning
confidence: 99%
“…This morphology with parallel straight atomic steps has been observed for the layers of binary and ternary (AlGa)N compounds, as well as in related heterostructures grown using both metal organic chemical vapor deposition (MOCVD) and plasma-assisted molecular beam epitaxy (PAMBE). [28,29] However, commercially these substrates cannot compete with cheap sapphire substrates commonly used for III-nitrides. In addition, AlGaN-based devices have a number of problems (point defects, quantumconfined Stark effect [QCSE], and transverse electric [TE]/ transverse magnetic [TM] polarization switching, described later) that cannot be completely solved even by the use of bulk AlN substrates.…”
Section: High Density Of Extended and Point Defectsmentioning
confidence: 99%
“…With the rising relevance of AlN as the platform for UV photonics and future RF electronics 8,28 , significant interest exists in using 2DEGs and 2DHGs on AlN to make RF p-channel 7,29 and n-channel transistors 30,31 and enable wide-bandgap RF CMOS type devices. Combining the results of this work with recent advancements in homoepitaxial growths of AlN 32,33 should enable fundamental scientific studies of 2DEGs and 2DHGs in such polar heterostructures and simultaneously enable significant technological advances.…”
Section: Discussionmentioning
confidence: 88%
“…For sample A, no intentional in-situ cleaning was performed, whereas for sample B, Al-assisted surface cleaning was employed before the MBE growth. The Al-assisted surface cleaning consists of multiple cycles of Al adsorption and desorption, similar to earlier reports on Al-polar AlN substrates (19,20). The substrate was first heated up to a thermocouple temperature of 1060 °C without nitrogen gas flow.…”
Section: Resultsmentioning
confidence: 98%