020 1st International Conference on Communications, Control Systems and Signal Processing (CCSSP) 2020
DOI: 10.1109/ccssp49278.2020.9151504
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Surface Flaw Classification Based on Dual Cross Pattern

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Cited by 8 publications
(3 citation statements)
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“…There are three categories of deep learning-based defect inspection systems, which are based on classification, object detection, and object segmentation. Classification-based defect inspection systems [13][14][15][16][17][18][19][20][21] categorize an input image as defect or non-defect and calculate the class probability using stacks of convolutional neural networks. This approach is simple, but it cannot localize defects.…”
Section: Introductionmentioning
confidence: 99%
“…There are three categories of deep learning-based defect inspection systems, which are based on classification, object detection, and object segmentation. Classification-based defect inspection systems [13][14][15][16][17][18][19][20][21] categorize an input image as defect or non-defect and calculate the class probability using stacks of convolutional neural networks. This approach is simple, but it cannot localize defects.…”
Section: Introductionmentioning
confidence: 99%
“…They have high requirements for image data, and they are unable to meet production needs due to their low efficiency and poor adaptability. [ 5 ] With the emergence and development of convolutional neural network (CNN), convolution kernels with stronger feature extraction capability and greater versatility have successfully replaced manual feature extraction. Consequently, target detection technology has begun to develop rapidly.…”
Section: Introductionmentioning
confidence: 99%
“…Due to their high representational ability, local texture descriptors-based approaches have been used extensively in many applications of computer vision. Among them: Local Phase Quantization (LPQ) [13], Local Binary Pattern (LBP) [14], Binarized Statistical Image Feature (BSIF) [15] and Dual Cross Pattern (DCP) [16]. The reason for employing local texture descriptors for palmprint recognition is the possibility of treating the palmprint image as micro-patterns compositions that are properly characterized by such descriptors.…”
Section: Introductionmentioning
confidence: 99%