The
structural, optoelectronic, and electrochemical properties
of the sol–gel prepared Zn1–x
(Ga0.5Al0.5)
x
O
samples are explored for their possible supercapacitor applications.
Rietveld analysis of X-ray diffraction patterns confirms that all
samples crystallize in a single wurtzite structure. Ga and Al incorporation
in ZnO leads to generate lattice strain in a host lattice, resulting
in reduction in the crystalline nature of the samples. The variation
in the band gap with increasing Ga and Al content was found to be
better scaled with the lattice parameters. Photoluminescence studies
suggest a defective lattice for x = 0.03, because
of the formation of more defect states such as oxygen vacancies near
the band-edges. X-ray photoelectron spectroscopy analysis at the O
1s edges supports the presence of oxygen-related defects in the samples.
A varying color emission from yellow to orange was observed with the
codoping as revealed from photoluminescence studies. However, oxygen
interstitial defects result in enhanced conductivity for the x = 0.01 sample. The enhanced electrochemical performance
was also achieved for the x = 0.01 sample with a
higher specific capacitance. The simultaneous doping of Ga and Al
gives a more extensive range of physical, optoelectronic, and electrochemical
properties of ZnO nanoparticles for supercapacitor applications.