2002
DOI: 10.1016/s0167-9317(02)00482-3
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Surface modification of Si-containing polymers during etching for bilayer lithography

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Cited by 27 publications
(30 citation statements)
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“…7 Recent studies on PDMS exposed to oxygen plasma by various surface characterizations have been reported. 9,10 However, the correlation between chemical properties and electrical properties still needs to be identified.…”
Section: Introductionmentioning
confidence: 99%
“…7 Recent studies on PDMS exposed to oxygen plasma by various surface characterizations have been reported. 9,10 However, the correlation between chemical properties and electrical properties still needs to be identified.…”
Section: Introductionmentioning
confidence: 99%
“…It has been shown in previous work [6,8] that exposure of Sicontaining polymers to O 2 -based plasmas leads to rapid oxidation of the polymer surface, transforming it to a silica-like thin (¼5 nm) layer. Therefore, this layer shows an appreciable resistance to etching in pure O 2 plasmas, in contrast to the organic underlayer (AZ5214).…”
Section: Production Of Smooth Surfacesmentioning
confidence: 99%
“…The observed formation of high roughness on Si-containing polymers treated in the RIE reactor is related to the relief of the compressive stress, developed between the bulk of the polymer lm and the silica-like thin layer (grown on the polymer surface during oxygen plasma treatment [8]), as the sample cools to room temperature following the plasma treatment. The developed stress is proportional to the temperature fall after treatment and the difference in the thermal expansion coef cients of the plasma-grown silica-like layer and the bulk polymer [9].…”
Section: Surfaces With Controlled High Roughnessmentioning
confidence: 99%
“…Surface modification typically includes oxidation of the PDMS surface to introduce functional hydroxyl groups that temporarily render the surface hydrophilic [18]. Previous studies have used X-ray photoelectron spectrometry (XPS) [19], scanning electron microscopy (SEM) [20] or transmission electron microscopy (TEM) [21], atomic force microscopy (AFM) [22], and film buckling [23][24][25][26] to show that the oxidation of bulk PDMS forms a thin silicate layer on the surface. However, micropost stiffness characterization [10,11,13-16,27,27] is typically conducted only before oxidation and neglects oxidation effects.…”
Section: Introductionmentioning
confidence: 99%