2001
DOI: 10.1063/1.1420579
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Surface morphology evolution during the overgrowth of large InAs–GaAs quantum dots

Abstract: The effects of GaAs overgrowth on the structural properties of large low-growth-rate InAs quantum dots (LGR-QDs) grown on GaAs(001) are examined using in situ scanning tunneling microscopy. Strongly anisotropic surface diffusion produces a characteristic valley-ridge structure above the LGR-QDs and the surface is not planarized even after a cap thickness >400 Å. The evolution of surface morphology proceeds very differently to the case of smaller conventional growth rate QDs capped under the same conditi… Show more

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Cited by 98 publications
(65 citation statements)
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“…It is well known that when islands are capped, they rapidly collapse in height but larger islands are expected to better maintain their height and have a larger In-content once capped. 24 The inset to Fig. 3 shows a bright field TEM image obtained from a bilayer sample with a seed layer grown at 492°C.…”
Section: A Effect Of Seed Layer Growth Temperaturementioning
confidence: 99%
“…It is well known that when islands are capped, they rapidly collapse in height but larger islands are expected to better maintain their height and have a larger In-content once capped. 24 The inset to Fig. 3 shows a bright field TEM image obtained from a bilayer sample with a seed layer grown at 492°C.…”
Section: A Effect Of Seed Layer Growth Temperaturementioning
confidence: 99%
“…Fabrication of ͑In,Ga͒As quantum dots ͑QDs͒ by molecular-beam epitaxy ͑MBE͒ has been extensively studied in order to obtain high quality low-dimensional quantum structures. [1][2][3] However, the random nucleation process during the formation of QDs undesirably leads to large size fluctuations, which, consequently, result in broad photoluminescence ͑PL͒ peaks, typically with line widths of 40-100 meV. A small PL line width is, however, of importance for QD lasers to reduce the threshold current.…”
mentioning
confidence: 99%
“…For the InAs-GaAs system, it is well established that ͑a͒ an alloyed InGaAs wetting layer ͑WL͒ is first formed during InAs deposition; 1 ͑b͒ the final state of the QDs may be an alloy even for deposition of pure InAs; 2 and ͑c͒ further changes to QD shape and composition take place during the capping of a QD array with GaAs or InGaAs. [3][4][5] These processes are controlled by a complicated combination of surface segregation 6 and locally strain-dependent surface migration and attachment. 5 Several experimental techniques have been used to probe the In distribution in QDs, including grazing incidence x-ray diffraction ͑XRD͒, 7 cross-sectional scanning tunneling microscopy ͑XSTM͒, 5,8 transmission electron microscopy ͑TEM͒ and scanning TEM energy dispersive x-ray analysis.…”
mentioning
confidence: 99%