Compact Modeling 2010
DOI: 10.1007/978-90-481-8614-3_1
|View full text |Cite
|
Sign up to set email alerts
|

Surface-Potential-Based Compact Model of Bulk MOSFET

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
14
0

Year Published

2011
2011
2024
2024

Publication Types

Select...
5
2

Relationship

1
6

Authors

Journals

citations
Cited by 26 publications
(17 citation statements)
references
References 58 publications
0
14
0
Order By: Relevance
“…Device Example: MOSFET Models in MAPP Fig. 15 shows the characteristic curves of several MOSFET models implemented in MAPP: BSIM6.1.0 [18], PSP level 103, version 3.0 [19], [20], the MIT Virtual Source (MVS) model, version 1.0.1 [21], MOS11 level 1101 version 2 [22]. The MVS model was hand-coded in ModSpec based on equations published in [21]; the rest were ported into MAPP using CoMeT, its Verilog-A parser and translator.…”
Section: Resultsmentioning
confidence: 99%
“…Device Example: MOSFET Models in MAPP Fig. 15 shows the characteristic curves of several MOSFET models implemented in MAPP: BSIM6.1.0 [18], PSP level 103, version 3.0 [19], [20], the MIT Virtual Source (MVS) model, version 1.0.1 [21], MOS11 level 1101 version 2 [22]. The MVS model was hand-coded in ModSpec based on equations published in [21]; the rest were ported into MAPP using CoMeT, its Verilog-A parser and translator.…”
Section: Resultsmentioning
confidence: 99%
“…As a basis we use the surface-potential based PSP MOSFET model [8]. Previous RTA approaches only apply relaxation to the total inversion charge.…”
Section: Rta Nqs Modelmentioning
confidence: 99%
“…where m 0 is the low field mobility, m E and u m are the model parameters for vertical field dependence which combines surface roughness scattering and surface phonon scattering mechanisms, C is the model parameter quantifying the effect of Coulomb scattering (critical for the cryogenic operation), and q i and q b are normalised inversion and bulk charge, respectively, at the 'surface potential midpoint' [2]. In the original PSP model the temperature variation of m 0 is given by…”
mentioning
confidence: 99%
“…This provides a robust and accurate description of low temperature MOSFET characteristics, including analogue performance. Simulations on a switched-capacitor integrator design are performed to illustrate the capabilities of the new model and to justify a new design methodology for the extended temperature range.Introduction: Two industry standard MOSFET models, BSIM [1] and PSP [2], are developed for the traditional temperature range (233-400 K) and have no real capabilities below 200 K. Hence they are not directly applicable to circuit simulations in the extended temperature range which may include cryogenic temperatures. Recent progress in the formulation of the surface-potential-based approach [3, 4] enables simulations for the 60 -400 K range that retain all the capabilities of the original PSP model including an extremely accurate and physical description of device characteristics and secondary effects in all regions of operation.…”
mentioning
confidence: 99%
See 1 more Smart Citation