Surface Potential of Graphene Oxide Investigated by Kelvin Probe Force Microscopy

Abstract

In the paper, the graphene oxide (GO) prepared by modified Hummers method was characterized by Raman spectrum, Fourier transform infrared spectrum (FTIR), and Atomic Force Microscopy (AFM). Using Kelvin Probe Force Microscopy (KPFM), the surface potential of GO was investigated, and it was found that the GO film exhibited the uniform surface potential distribution. The surface potentials at the edges and wrinkles of GO film were much lower than that at the in-plane flat area, which is proposed to be contributed to the bonds' unsaturated and disorder at these zones. These results provide insight into understanding electronic properties of GO-based composites and devices.

Seeing is believing: atomic force microscopy imaging for nanomaterial research

“…SSPM has also been applied to many other nanodevices (CdTe/CdS solar cells, 178 organic eld-effect transistors, 179 single crystal solar cells, 180 epitaxial graphene devices, 181 and CZTSSe solar cells 182 ), hybrid nanocomposites (nanoparticles/polymer hybrid blends, 183 Au nanoparticles on TiO 2 nanotubes, 184 and silver-TiO 2 (ref. 185)), ZnO nanowires, 186 graphene, [187][188][189] MoS 2 nanoakes, 190 and ZnO nanorods. 191…”