Using in situ X-ray
photoelectron spectroscopy
(XPS), the effects of low energy (500 eV) electrons and low energy
(1200 eV) Ar+ ions on thin films of Fe(CO)5,
a prototypical organometallic precursor, have been investigated. These
studies were motivated by the important role that these surface reactions
play in the charged-particle-induced deposition of nanostructures.
XPS data from the C(1s) and O(1s) regions were used to construct kinetic
models to describe the effects of electron and ion irradiation, both
of which occurred through a sequence of two sequential surface reactions,
although the details of each step differ. During electron irradiation,
precursor molecules initially decompose as a result of electronic
excitation, resulting in desorption of approximately 50% of the CO
ligands and partial decarbonylation within the Fe(CO)5 film.
In the second step, the partially decarbonylated intermediates undergo
a much slower electron-stimulated CO decomposition process to produce
iron oxides encased in a graphitic film. Fe2(CO)9 and Fe3(CO)12 reacted similarly to Fe(CO)5, but the initial rate of decomposition was an order of magnitude
higher. During Ar+ bombardment, Fe(CO)5 molecules
decompose as a consequence of energy transfer from the incident ions,
causing complete fragmentation of the precursor and desorption of
≈80% of the CO molecules. The remaining 20% undergo CO
bond cleavage, forming adsorbed carbon and volatile oxygen species.
In the second step of the reaction, the residual iron and carbon atoms
are subject to Ar+ ion sputtering. The implications of
these reactions for focused ion beam-induced deposition (FIBID) and
focused electron beam-induced deposition (FEBID) from Fe(CO)5 are also discussed.