Surface structure of the PAN‐based carbon fibres studied by the scanning probe microscopy (SPM)

Zhdan, P. A.; Grey, Douglas; Castle, J. E.

doi:10.1002/sia.740220163

Cited by 15 publications

(7 citation statements)

References 13 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The diameters of the SCFs are in the range of 7-12 μm. It can be found that the SCFs have a typical trench-structure of CFs [25][26][27]. But the trench of the treated SCFs is relatively deeper than that of the untreated sample.…”

Section: Characterization Of Scfs and Mwcntsmentioning

confidence: 99%

Multi-walled carbon nanotubes as secondary fibre fillers for property improvement of short carbon fibre-reinforced silicone rubber

Duan

Liu

et al. 2019

Bull Mater Sci

View full text Add to dashboard Cite

To improve the properties of room temperature vulcanized (RTV) silicone rubber, functional multi-walled carbon nanotubes (MWCNTs) and short carbon fibres were added into the RTV silicone rubber as hybrid fibre fillers. The functionalized MWCNTs were characterized by transmission electron microscopy and X-ray photoelectron spectroscopy. The mechanical, thermal and ablative properties of the fabricated RTV silicone rubber composites were investigated. Their properties were enhanced by adding the functionalized MWCNTs with appropriate contents. The tensile strength and tear strength of the composites are improved from 4.0 MPa and 20.3 kN m −1 to 4.3 MPa and 21.3 kN m −1 , respectively, when the MWCNT content increased from 0 to 0.5 phr. In addition, the decomposition temperatures at the onset point and 50% mass loss increased from 493.4 and 564.4 • C to 498.8 and 612.4 • C, respectively. The mass and line ablation rates also decreased from 0.062 g s −1 and 0.148 mm s −1 to 0.059 g s −1 and 0.145 mm s −1 , respectively.

show abstract

Section: Characterization Of Scfs and Mwcntsmentioning

confidence: 99%

Multi-walled carbon nanotubes as secondary fibre fillers for property improvement of short carbon fibre-reinforced silicone rubber

Duan

Liu

et al. 2019

Bull Mater Sci

View full text Add to dashboard Cite

show abstract

“…Additional ex situ and in situ STM and SFM experiments validated this approach and demonstrated that the use of STM opens up new possibilities for more careful control and modification of the electrochemical activation process for carbon fibres to produce new high-performance composite materials. 6,7 Corrosion products formed on the 90Cu-10Ni alloy Scanning tunnelling microscopy has been used successfully to image in air the surface layers of Au, Ag, Pt, Ni, Cu, MoS 2 , conducting polymers, amorphous carbon, blue (conducting) diamond, diamond-like carbon films, carbon fibres, graphite, doped semiconductors, liquid crystals and other materials. 4 It was also applied successfully for the characterization of surface morphology, composition and atomic structure of 'real' corrosion products formed on 90Cu-10Ni coupons exposed for 120 days in aerated synthetic seawater at…”

Section: Carbon Fibresmentioning

confidence: 99%

“…The SiC fibres represent an average volume of 34%. The material should be used at a final temperature of ¾1200°C, but at this temperature the difference between the coefficient of thermal expansion of the matrix and that of the fibre is 1.3 ð 10 6 . This difference generates numerous stresses within the composite.…”

Section: Stress Analysis and Characterization Of The Microstructure Wmentioning

confidence: 99%

Nanoscale surface characterization of conducting and non‐conducting materials with STM and contact SFM: some problems and solutions

Zhdan

2002

Surface & Interface Analysis

View full text Add to dashboard Cite

Methods of scanning tunnelling microscopy (STM) and of contact scanning force microscopy (CSFM) are widely used in many academic and industrial laboratories for nanoscale surface characterization of conducting and insulating materials. These techniques allow for very high (atomic) resolution to be achieved in different environments -vacuum, air and liquids -not to mention their ability to evaluate quantitatively selected surface features, including statistical analysis of corrugations, which permits roughness parameters to be determined on the nano-and microscale. Many CSFM systems are used now in industrial research laboratories, quality assurance and control departments where precise surface feature dimensioning of roughness analysis is critical for product development or process control. Each STM and CSFM user comes up against these tasks regularly during his/her daily work, therefore thorough understanding of the main principles, advantages and limitations of specific operation modes is the basis for appropriate setting of the experiments and for interpretation of acquired STM and CSFM data.Here, using a variety of experimental results obtained in our laboratory during the last few years for a number of different conducting and non-conducting materials, some principal questions and problems related to the practical aspects of STM and CSFM are reviewed and discussed in detail: requirements for samples to be studied and their preparation for investigation, optimization of the experimental set-up and acquisition parameters for different environments; and correct interpretation of the acquired experimental data. We hope that practical recommendations given in this paper will be useful to new users of STM and CSFM, introducing them to this field and helping in their experimental work, especially when studying 'difficult' samples.

show abstract

“…193 Other workers prepared fibers by fixing them to the sample platelet at two points at the ends. 194,195 Embedding in resin as for electron microscopy and cutting and polishing or ultramicrotomy can provide information on fiber cross-sections. 93,196 -198 For the investigation of fully consolidated sol -gel coatings on glass fibers, however, a further preparation step was necessary: the coating thickness could be determined after mild etching with HF.…”

Section: Fixation Coated Fibers and Small Particlesmentioning

confidence: 99%

Microscopy of Coatings

Rädlein¹

2000

Encyclopedia of Analytical Chemistry

View full text Add to dashboard Cite

Fundamental research on films and the development and optimization of coatings are not possible without high‐resolution imaging. This article describes the advantages and disadvantages of the newly introduced scanning probe microscopy (SPM) in comparison with well‐established microscopy techniques with light and particles [e.g. scanning electron microscopy (SEM) and transmission electron microscopy (TEM)], which are limited by the diffraction limit, i.e. 200 nm for conventional light microscopy and 4 nm for SEM. This limit does not hold for SPM, which uses near‐field interactions for imaging. Thus, even simple atoms or molecules can be resolved on well‐ordered structures by scanning tunneling microscopy (STM) or atomic force microscopy (AFM). Both possess an extremely good height sensitivity of 0.02 nm. 1 In the constant‐height operation mode, AFM can detect vertical forces as low as 10 −15 –10 −4 N. Atomic resolution is not always possible or not always necessary for many practical applications; a lateral resolution of a few nanometers is sufficient. Besides the capability of achieving this value with ease, simple sample preparation, versatile environmental conditions and observation of reactions in situ are advantages of STM and AFM. Especially AFM has proved to be a useful technique for investigating coatings, because it is independent of conductivity and provides topographic data together with information on structure, local variations of mechanical properties and surface alterations in different media. However, some artifacts and restrictions have to be considered which can differ considerably from customary electron micrographs with comparable resolutions, such as onset overswing and tip convolution. Microscopy helps in solving coating problems according to substrate quality, nucleation, wettability, thickness, roughness, microstructure, crystal phases (texture, orientation), lateral and vertical homogeneity, density, porosity, interfaces, adhesion, hardness, stress, scratch and abrasion resistance, tribology, wear and corrosion. Practical examples of microscopy results on these questions are presented together with suitable preparation methods and interpretation of artifacts.

show abstract

Surface structure of the PAN‐based carbon fibres studied by the scanning probe microscopy (SPM)

Cited by 15 publications

References 13 publications

Multi-walled carbon nanotubes as secondary fibre fillers for property improvement of short carbon fibre-reinforced silicone rubber

Multi-walled carbon nanotubes as secondary fibre fillers for property improvement of short carbon fibre-reinforced silicone rubber

Nanoscale surface characterization of conducting and non‐conducting materials with STM and contact SFM: some problems and solutions

Microscopy of Coatings

Contact Info

Product

Resources

About