Surface studies on 100MeV Ag7+ ions and 150MeV Ni11+ ions irradiated nanocrystalline ferrite thin films

Ghosh, Sanjukta; Khan, Saif A.; Ganesan, V.; Kundu, Sourav; Bhattacharya, R.

doi:10.1016/j.nimb.2005.11.158

Cited by 16 publications

(4 citation statements)

References 15 publications

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“…Considering small grain volumes of the Fe/Bi system we suppose that the heat gets confined within the grain volume [17]. This gives rise to non-equilibrium state [18], which as a consequence raises the volumes of the grains resulting in grain agglomeration at higher fluences. Our AFM results are in good agreement with this explanation.…”

Section: Resultsmentioning

confidence: 99%

SHI induced surface modifications of immiscible Fe/Bi bilayer system

Gupta

Agarwal

Khan

et al. 2009

Surface and Coatings Technology

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Section: Resultsmentioning

confidence: 99%

SHI induced surface modifications of immiscible Fe/Bi bilayer system

Gupta

Agarwal

Khan

et al. 2009

Surface and Coatings Technology

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“…Considering small grain volumes of the Fe-Bi system we suppose that the heat gets confined within the grain volume [33]. This gives rise to a nonequilibrium state [34], which as a consequence increases the volumes of the grains resulting in grain agglomeration at higher fluences. This spectacular increase in surface roughness may also be attributed to the effect of ions arising from the electronic excitation-induced shear motion of the atoms towards the surface, which could result in agglomeration on the surface.…”

Section: Atomic Force Microscopymentioning

confidence: 99%

Smoothing, roughening and sputtering: the complex evolution of immiscible Fe/Bi bilayer system

Gupta

Chauhan

Agarwal

et al. 2008

J. Phys. D: Appl. Phys.

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In this work, swift heavy ion (SHI) induced surface smoothing, roughening and sputtering of thermally immiscible Fe/Bi bilayer system has been investigated. The pristine and irradiated samples were analysed by Rutherford backscattering spectrometry (RBS), grazing angle x-ray diffraction (XRD), atomic force microscopy and scanning electron microscopy including x-ray dispersive energy analyzer. RBS analysis revealed that steepness of the low energy edge of the Bi signal increases at a fluence of 3 × 1013 ions cm−2, beyond which the slope of the rear edge decreases. The increased steepness is due to smoothing induced at initial fluence; however, the decrease in the slope of rear edge beyond 3 × 1013 ions cm−2 fluence is a result of surface roughening. XRD reveals the increase in the crystalline nature of Bi after irradiation at 3 × 1013 ions cm−2. Irradiation at higher fluences from 6 × 1013 to 1 × 1014 ions cm−2 leads to a decrease in the crystalline nature of Bi. Surface roughness of pristine and irradiated samples from AFM analysis revealed that initially roughness decreases with a fluence of 3 × 1013 ions cm−2. However, at higher fluences, beyond 3 × 1013 ions cm−2, the agglomeration of smaller grains has been observed due to the shear flow mechanism, which results in surface roughening. The observed behaviour of surface smoothing and roughening under SHI irradiation may be explained on the basis of the thermal spike model.

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“…Considering small grain volumes, we suppose that heat gets confined within the grain volume. This gives rise to a non-equilibrium state, which, as a consequence, raises the volume of the grains resulting in grains agglomeration on the surface [23]. Upon irradiation with 1 × 10 12 and 1 × 10 13 ions cm −2 the grain size decreases, which results in a decrease in the refractive index.…”

Section: Resultsmentioning

confidence: 99%

100 MeV Ag ions irradiation effects on the optical properties of Ag_0.10(Ge_0.20Se_0.80)_0.90 thin films

Kumar

Tripathi

Kulriya

et al. 2010

J. Phys. D: Appl. Phys.

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This paper reports the effect of 100 MeV Ag swift heavy ion (SHI) irradiation with fluences ranging from 1 × 1011 to 1 × 1013 ions cm−2 on the optical properties of Ag0.10(Ge0.20Se0.80)0.90 thin films. It has been observed that the SHI irradiation changes the refractive index (n) and the oscillator strength (E d). The data on the dispersion of the refractive index, n(λ), have been determined using the single-effective-oscillator model. We observed an increase in E d and refractive index (n) at lower ion fluence (1 × 1011 ions cm−2), followed by the reversal in the trend at higher fluences. The optical gap has been determined by Tauc's plot. The values of decrease with ion fluence. Results have been explained in terms of the structural changes in thin films.

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Surface studies on 100MeV Ag7+ ions and 150MeV Ni11+ ions irradiated nanocrystalline ferrite thin films

Cited by 16 publications

References 15 publications

SHI induced surface modifications of immiscible Fe/Bi bilayer system

SHI induced surface modifications of immiscible Fe/Bi bilayer system

Smoothing, roughening and sputtering: the complex evolution of immiscible Fe/Bi bilayer system

100 MeV Ag ions irradiation effects on the optical properties of Ag_0.10(Ge_0.20Se_0.80)_0.90 thin films

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Surface studies on 100MeV Ag7+ ions and 150MeV Ni11+ ions irradiated nanocrystalline ferrite thin films

Cited by 16 publications

References 15 publications

SHI induced surface modifications of immiscible Fe/Bi bilayer system

SHI induced surface modifications of immiscible Fe/Bi bilayer system

Smoothing, roughening and sputtering: the complex evolution of immiscible Fe/Bi bilayer system

100 MeV Ag ions irradiation effects on the optical properties of Ag0.10(Ge0.20Se0.80)0.90 thin films

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100 MeV Ag ions irradiation effects on the optical properties of Ag_0.10(Ge_0.20Se_0.80)_0.90 thin films