“…Random testing (RT) is often used as one of the common methods for test case generation due to its simple, efficient and easy-to-implement algorithm, but at the same time, random testing also tends to lead to problems such as redundancy and low coverage of test cases [1].In recent years, an improved adaptive random testing (ART) method has been proposed to improve the test coverage of random tests, as shown in Figure 1,which has received a high level of attention and has spawned a variety of ARTs with different strategies, mainly divided into four major categories: distance-based ART [2], restriction-based ART [3], division-based ART [4] [5], and other ART(grid-based ART) [6]. The above methods have significantly improved fault detection compared to RT, but they all face many problems, such as high time costs, significant boundary effects and unsuitable high-dimensional input domains.Rubing Huang et al proposed an adaptive small-world graph-based stochastic test method (SWFC-ART) to improve the computational efficiency of FSCS-ART by reducing the computational overhead of FSCS-ART from quadratic to log-linear order while maintaining the fault detection efficiency of FSCS-ART with consistency in the high-dimensional input domain [7].Mengting Quan et al proposed the FSCS-ART algorithm based on a central compensation strategy in order to address the boundary effect and computational efficiency of FSCS-ART [8].In response to two types of problems in the FSCS-ART method, namely poor fault detection and low operational efficiency, Zhilei Chen et al proposed ART-DGR, an adaptive random test case generation algorithm based on grid area density [9].Chen et al proposed a distance-aware forgetting strategy for fixed candidate set size ART (DF-FSCS), which takes into account the spatial distribution of test cases and ignores test cases outside the "line of sight" of a given candidate in order to reduce the distance computation cost. It also uses dynamic adjustment of partitioning and second round of forgetting to ensure the linear complexity of the DF-FSCS algorithm [10].Chen et al also proposed a new test case generation method based on iterative partitioning, which reduces the overhead of test case generation by dividing the input field into equal cells [11].C.…”