Recently, abstract current mirror and voltage mirror elements have been proposed for behavioral modeling of active analog blocks. Such artificial elements and the traditionally used nullor element together are called pathological elements in the literature. Pathological elements are very useful in modeling and analysis of active network. Hence, researchers have been motivated to study symbolic analysis methods for networks containing pathological elements. However, so far, only nodal admittance matrix analysis has been formulated. In this work, an alternative two-graph method is formulated, which has the advantage of providing a compact intermediate form for subsequent symbolic term generation. With a compact two-graph representation, either a matrix method or a tree enumeration method can be employed. For completeness, the classical two-graph theory has been extended in this paper to encompass all four types of dependent sources and all pathological elements. Illustrative examples are presented to demonstrate the principle of compact symbolic term generation by the presented two-graph method.The classical two-graph method developed in the 1960s was only applicable to networks containing RCL-g m elements, that is, elements of R (resistor), C (capacitor), L (inductor), and g m (voltage-controlled current 1128 G. SHI