2000
DOI: 10.1016/s0168-9002(99)00870-0
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Synchrotron calibration and response modelling of back-illuminated XMM-RGS CCDs

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Cited by 13 publications
(7 citation statements)
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“…Edges due to Si, Al, Mg, and F are clearly visible. Additional measurements were performed at the Bessy synchrotron facility, in order to map the X-ray Absorption Fine Structure (variations up to a few %, see Bootsma et al 2000).…”
Section: Ccd Responsementioning
confidence: 99%
“…Edges due to Si, Al, Mg, and F are clearly visible. Additional measurements were performed at the Bessy synchrotron facility, in order to map the X-ray Absorption Fine Structure (variations up to a few %, see Bootsma et al 2000).…”
Section: Ccd Responsementioning
confidence: 99%
“…Charge that is generated close to the surface of a backilluminated CCD by the interaction of a low energy X-ray can be lost to the generation/recombination centres present [20], especially if the device is not deep-depleted and the generated electrons can drift in a field-free region [21]. The resulting partial event would affect the value found for the Modified Fano Factor.…”
Section: B Generation/recombination Centre Charge Lossmentioning
confidence: 99%
“…A few charge diffusion models available in the literature can be found. A well accepted model used by a variety of authors in the literature (Bootsma et al 2000, McCarthy et al 1995 determines that the charge diffusion can be approximated to a Gaussian, with standard deviation σ f f (1), if projected on the charge collection layer (Janesick et al 1985).…”
Section: Charge Diffusion Modelmentioning
confidence: 99%