Synergistic effect of polyindole decoration on bismuth neodymium ferrite powder for achieving wideband microwave absorber

Wei, Yanming; Dong, Sanfeng; Mehrez, Sadok; Akhtar, Majid Niaz; Giang, Ho Tra

doi:10.1016/j.ceramint.2022.05.159

Cited by 5 publications

(1 citation statement)

References 21 publications

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“…Besides C, Bi, and O elements, the XPS spectrum also indicates presence of pure Fe and Fe 3+ content at 709-727 eV on the surface, which could be potentially be related to the parasitic compound of Fe 3 O 4 oxide [23]. Fe 2p 3/2 and Fe 2p 1/2 [24] both correspond with Fe 2+ and can be observed on the spectrum (Figures 6g and 7g) [25]. The satellite peaks were observed on both spectra (Figures 6g and 7g).…”

Section: Results and Observationmentioning

confidence: 95%

Exploring the Piezoelectric Properties of Bismuth Ferrite Thin Films Using Piezoelectric Force Microscopy: A Case Study

et al. 2023

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Over recent decades, the scientific community has managed to make great progress in the theoretical investigation and practical characterization of bismuth ferrite thin films. However, there is still much work to be completed in the field of magnetic property analysis. Under a normal operational temperature, the ferroelectric properties of bismuth ferrite could overcome the magnetic properties due to the robustness of ferroelectric alignment. Therefore, investigation of the ferroelectric domain structure is crucial for functionality of any potential devices. This paper reports deposition and analyzation of bismuth ferrite thin films by Piezoresponse Force Microscopy (PFM) and XPS methods, aiming to provide a characterization of deposited thin films. In this paper, thin films of 100 nm thick bismuth ferrite material were prepared by pulsed laser deposition on multilayer substrates Pt/Ti(TiO2)/Si. Our main purpose for the PFM investigation in this paper is to determine which magnetic pattern will be observed on Pt/Ti/Si and Pt/TiO2/Si multilayer substrates under certain deposition parameters by utilizing the PLD method and using samples of a deposited thickness of 100 nm. It was also important to determine how strong the measured piezoelectric response will be, considering parameters mentioned previously. By establishing a clear understanding of how prepared thin films react on various biases, we have provided a foundation for future research involving the formation of piezoelectric grains, thickness-dependent domain wall formations, and the effect of the substrate topology on the magnetic properties of bismuth ferrite films.

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Section: Results and Observationmentioning

confidence: 95%