2018
DOI: 10.4028/www.scientific.net/kem.766.205
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Synthesis and Characterization of Cu-Doped SnO<sub>2</sub> Thin Films by Aerosol Pyrolysis Technique for Gas Sensor Application

Abstract: Thin films of un-doped and Cu-doped tin oxide were synthesized on quartz substrates by the purpose-built aerosol pyrolysis apparatus from 0.2 M SnCl4.5H2O – ethanol solution. CuCl2.2H2O was used as a source of Cu dopant. The Cu dopant of 1, 3 and 5 wt.% were used for doping SnO2 film. The morphological, structural, optical and electrical properties under the influence of the Cu-doping was examined by FE-SEM, XRD, UV-Vis transmission spectroscopy and Hall effect measurement technique. XRD patterns of all films … Show more

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Cited by 3 publications
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“…Figure 4A is the Sn3d spectrum of the AuNPs-SnO 2 -rGO ternary nanocomposite. As can be seen from the figure, two strong peaks occur at 486.36 and 494.81 eV, attributed to the binding energy of Sn3d 3/2 and Sn3d 5/2 , respectively, indicating the SnO 2 formation (Khlayboonme and Thowladda, 2018; Nguyet et al, 2018). Figure 4B reveals the Au4f spectrum of the AuNPs-SnO 2 -rGO hybrid, confirming the Au presence in the hybrids, with significant signals at 87.6 and 83.36 eV corresponding to metallic Au (Meng et al, 2017).…”
Section: Resultsmentioning
confidence: 96%
“…Figure 4A is the Sn3d spectrum of the AuNPs-SnO 2 -rGO ternary nanocomposite. As can be seen from the figure, two strong peaks occur at 486.36 and 494.81 eV, attributed to the binding energy of Sn3d 3/2 and Sn3d 5/2 , respectively, indicating the SnO 2 formation (Khlayboonme and Thowladda, 2018; Nguyet et al, 2018). Figure 4B reveals the Au4f spectrum of the AuNPs-SnO 2 -rGO hybrid, confirming the Au presence in the hybrids, with significant signals at 87.6 and 83.36 eV corresponding to metallic Au (Meng et al, 2017).…”
Section: Resultsmentioning
confidence: 96%
“…The lattice constants (a = b and c) were calculated by the relation between inter-planar spacing (d) and Miller indices (hkl) from eq. (3.2) [11]:…”
Section: X-ray Diffraction Analysismentioning
confidence: 99%
“…The dislocation density (δ) defined as the length of dislocation lines per unit volume of the crystal, and was calculated from D using eq. (3.3) [11]:…”
Section: X-ray Diffraction Analysismentioning
confidence: 99%