Synthesis and characterization of SmNiO
            <sub>3</sub>
            thin films

Ihzaz, N.; Pignard, S.; Kreisel, J.; Vincent, H.; Marcus, J.; Dhahri, J.; Oumezzine, M.

doi:10.1002/pssc.200304422

Cited by 21 publications

(21 citation statements)

References 13 publications

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“…Bragg reflections h0h of the thin films are clearly seen nearby 00l reflections of the substrate. Furthermore, the sharpness of the diffraction peaks of the NMO thin film with 200nm in thickness film and the fact that the h0h Bragg reflection almost coincide with 00l Bragg peaks of STO (c STO =0.3905 nm) indicates that this film is epitaxially grown on the substrate with similar orientation relationship that given or studied in the previous works [12,13]. This means that the NMO thin film with 200nm in thickness grown on the STO substrate presents a fairly good crystallinity and a strong in-plane texture with the [101]-axis perpendicular to the surface of the substrate.…”

Section: Resultssupporting

confidence: 63%

Physical and structural studies of chemical Vapor deposited lacunar neodymium manganite thin films

Ihzaz

Boudard

Rapenne

et al. 2012

EPJ Web of Conferences

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Abstract. Lacunar Nd 1-x MnO 3-δ thin films were successfully deposited by a liquid source metal-organic MOCVD technique on (001) SrTiO 3 (STO), LaAlO 3 (LAO) and Si substrates. Optimal growth conditions are reported. TEM and X-ray diffraction characterisations reveal that the thin films grown on STO and LAO substrates are single crystalline layers epitaxially grown on the top of the substrates. The relationship between the crystallographic orientation of the films and those of the substrates were determined. Magnetic transition temperatures (Tc) of the as-grown STO films, deduced from Squid Magnetometer measurements, are compared to the corresponding bulk values (typically 100K). Our magnetic measurements also suggest a complicated magnetic behavior close to the one observed in bulk samples: magnetization curves obtained under different applied magnetic fields indicate a possible reverse of the magnetization sign at low temperatures.

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Section: Resultssupporting

confidence: 63%

Physical and structural studies of chemical Vapor deposited lacunar neodymium manganite thin films

Ihzaz

Boudard

Rapenne

et al. 2012

EPJ Web of Conferences

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“…[1][2][3][4][5] . The radius of the rare earth element controls the bond lengths as well as the tilt of the (N iO 6 ) 3− octahedra, and hence the orbital overlap which allows a large variation in the electron interaction within the RNiO 3 family 5,6 .…”

mentioning

confidence: 99%

“…Fig. 4a shows the normalized S (2) f1 (f 2 ) of noise of the sample at different temperatures and the second spectrum was generally weakly frequency-dependent irrespective of temperature. Close to T IM it exceeds the expected Gaussian background by several orders and this indicates emergence of strong nonGaussian component of resistivity fluctuation at the PI-PM transition.…”

mentioning

confidence: 99%

“…The second spectrum serves as an estimate of the non-Gaussian component of the resistivity fluctuation and strong nonGaussian component indicates two possibilities: (i) long range correlation between fluctuators associated with the atomic avalanches which also results in frequencydependent second spectrum (S (2) f1 (f 2 )) (Ref 34,35 ) and (ii) co-existance of phases with unequal resistivities which gives rise to a percolative network. In the latter case, metallic element of the network having lower resistivity carries larger current whereas the insulating element in parallel having larger resistivity carries lower current which is known as dynamical current redistribution (DCR) 38 .…”

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confidence: 99%

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Conductivity noise study of the insulator-metal transition and phase coexistence in epitaxial samarium nickelate thin films

Sahoo

Ramanathan

et al. 2014

Phys. Rev. B

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Interaction between the lattice and the orbital degrees of freedom not only makes rare-earth nickelates unusually "bad metal", but also introduces a temperature driven insulator-metal phase transition. Here we investigate this insulator-metal phase transition in thin films of SmNiO3 using the slow time dependent fluctuations (noise) in resistivity. The normalized magnitude of noise is found to be extremely large, being nearly eight orders of magnitude higher than thin films of common disordered metallic systems, and indicates electrical conduction via classical percolation in a spatially inhomogeneous medium. The higher order statistics of the fluctuations indicate a strong non-Gaussian component of noise close to the transition, attributing the inhomogeneity to co-existence of the metallic and insulating phases. Our experiment offers a new insight on the impact of lattice-orbital coupling on the microscopic mechanism of electron transport in the rareearth nickelates.The interest in Perovskite nickelates (RNiO 3 , R = rare earth elements) originates from a rich phase space that exhibits many interesting phenomena including sharp insulator-metal transition, charge or orbital ordering, magnetic ordering etc.1-5 . The radius of the rare earth element controls the bond lengths as well as the tilt of the (N iO 6 ) 3− octahedra, and hence the orbital overlap which allows a large variation in the electron interaction within the RNiO 3 family 5,6 . The correlation effects are however complicated by the structural uniqueness of these compounds. For small radius, e.g. R = Sm, Eu, Gd,..., Lu, an antiferromagentic insulator (AFI) ground state is stabilized along with a monoclinic distortion of the crystal structure at low temperatures (T ). With increasing T , two successive phase transitions occur, (i) AFI to PI (paramagnetic insulator) magnetic transition at the Neel temperature T N , and (ii) PI to PM (paramagnetic metal) transition at T IM associated with structural transition from the monoclinic (P 2 1 /n) to orthorhombic (P bnm) symmetries 6-8 . Due to the complex interplay between the structural distortions and Ni−O orbital interactions, the nature of the AFI-PI and PI-PM transitions remains poorly understood, in spite of many experimental investigations in the past 9-13 .SmNiO 3 is unique in the sense that it exists in the intermediate regime between strong and weak interelectron interaction regimes, and displays the highest T N , in the rare earth nickelate family. For smaller ionic radii, i.e. for R = Sm, Eu, Gd, Dy, etc, where T N < T IM , the PI-PM transition is suggested to be first order in nature 1,14 , although the microscopic details of this first order phase transition remains obscured. For SmNiO 3 , the only evidence so far for a structural transition at T IM is an indirect Raman comparison with NdNiO 3 (Ref 10 ). While the conventional time-averaged electrical resistivity measurements can indicate an overall change in the nature of electronic states, i.e. from an insulator to a metal, alternative experim...

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“…Bragg reflections h0h of the thin films are clearly seen nearby 00l reflections of the substrate and are much more important for the 150 nm thick film. Furthermore, the sharpness of the diffraction peaks of the NMO 150 nm thick film and the fact that the h0h Bragg reflection almost coincide with 00l Bragg peaks of STO (c STO =0.3905 nm) indicates that this film is epitaxially grown on the substrate with similar orientation relationship that in the previous section [15,17]. This means that the NMO 150 nm thick film grown on the STO substrate presents a fairly good crystallinity and a strong in-plane texture with the [101]-axis perpendicular to the surface of the substrate.…”

Section: Ndmno3 Thin Filmsmentioning

confidence: 54%

Structural characterization of PbTi0₃, Sm_0.6Nd_0.4NiO₃and NdMnO₃multifunctional Perovskite thin films

Boudard

Girardot

Ihzaz

et al. 2012

EPJ Web of Conferences

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Abstract. Different multifunctional (PbTiO 3 , Sm 0.6 Nd 0.4 NiO 3 , NdMnO 3 ) thin films were grown by metalorganic chemical vapor deposition (MOCVD) technique on SrTiO 3 and LaAlO 3 substrates. TEM and X-ray diffraction measurements reveal that almost single crystalline thin films can be epitaxially grown on the top of substrates. The relationship between the crystallographic orientation of the films and those of the substrates were determined by reciprocal space mapping and TEM analyses. PbTi0 3 thin films appear to be under tensile or compressive strain according to the different mismatch of their cell parameter with those of the substrate. Relaxation mechanism as a function of the film thickness arises from coexistence of different type of domains and size and strain effect are analyzed. SmNiO 3 thin films present diffuse scattering strikes and are less well organized when compared to PbTi0 3 thin films. Different domains are observed as well as an additional parasitic phase close to NiO. Its regular distribution can be associated to reduced transport properties. Preliminary observations on NdMnO 3 thin films show that an amorphous phase is obtained during MOCVD that can be transformed in a single crystalline film by annealing. The films are under tensile or compressive strain according to the different mismatch of their cell parameter with those of the substrate. Magnetic properties are investigated.

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Synthesis and characterization of SmNiO ₃ thin films

Cited by 21 publications

References 13 publications

Physical and structural studies of chemical Vapor deposited lacunar neodymium manganite thin films

Physical and structural studies of chemical Vapor deposited lacunar neodymium manganite thin films

Conductivity noise study of the insulator-metal transition and phase coexistence in epitaxial samarium nickelate thin films

Structural characterization of PbTi0₃, Sm_0.6Nd_0.4NiO₃and NdMnO₃multifunctional Perovskite thin films

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Synthesis and characterization of SmNiO 3 thin films

Cited by 21 publications

References 13 publications

Physical and structural studies of chemical Vapor deposited lacunar neodymium manganite thin films

Physical and structural studies of chemical Vapor deposited lacunar neodymium manganite thin films

Conductivity noise study of the insulator-metal transition and phase coexistence in epitaxial samarium nickelate thin films

Structural characterization of PbTi03, Sm0.6Nd0.4NiO3and NdMnO3multifunctional Perovskite thin films

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Synthesis and characterization of SmNiO ₃ thin films

Structural characterization of PbTi0₃, Sm_0.6Nd_0.4NiO₃and NdMnO₃multifunctional Perovskite thin films