2021
DOI: 10.3390/ma14216345
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Synthesis and Effect of the Structure of Bithienyl-Terminated Surfactants for Dielectric Layer Modification in Organic Transistor

Abstract: A series of bithienyl-terminated surfactants with various alkyl chain lengths (from C8 to C13) and phosphono or chlorodimethylsilyl anchoring groups were synthesized by palladium-catalyzed hydrophosphonation, or platinum-catalyzed hydrosilylation as a key step. Surfactants were tested in pentacene or α-sexithiophene-based organic field-effect transistors (OFETs) for the modification of the dielectric surface. The studied surfactants increased the effective mobility of the α-sexithiophene-based device by up to … Show more

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Cited by 4 publications
(3 citation statements)
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References 38 publications
(45 reference statements)
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“…Therefore, the interfacial quality between the OSC and the dielectric seriously affects the transport behavior of charge carriers. For instance, the structural defects and polar functional groups on the dielectric surface would induce interfacial traps, and they act as energetic traps or carrier scattering centers, which will lead to large SS and V th in OFETs. Therefore, elimination of the structural and energetic defects at the interface between gate dielectric and OSC is a prerequisite for the achievement of low-voltage OFETs.…”
Section: Lowering the Trap Densitymentioning
confidence: 99%
“…Therefore, the interfacial quality between the OSC and the dielectric seriously affects the transport behavior of charge carriers. For instance, the structural defects and polar functional groups on the dielectric surface would induce interfacial traps, and they act as energetic traps or carrier scattering centers, which will lead to large SS and V th in OFETs. Therefore, elimination of the structural and energetic defects at the interface between gate dielectric and OSC is a prerequisite for the achievement of low-voltage OFETs.…”
Section: Lowering the Trap Densitymentioning
confidence: 99%
“…Concerning the OTFT architecture, the focus has been placed on the optimization of the dielectric–semiconductor interface by comparing two different passivation layers, that is, polystyrene (PS) and octadecyltrichlorosilane (OTS). This element also plays a key role in determining the performance of the final device. In order to get further insight into the role of these structural features and the main core design, the elucidation of the crystal structures represented a crucial step. In this context, the resolution via powder X-ray diffraction (PXRD) proved as a valuable support for the interpretation of derivatives 1a , 1b, and 1d , which represent the only reported crystal structures of N -trialkylated diindolocarbazole derivatives to date.…”
Section: Introductionmentioning
confidence: 99%
“…Regarding the architecture of the device, the focus has been placed on optimizing the interface between these semiconductors and the Si/SiO 2 substrate in a bottom-gate top-contact OTFT. In fact, the presence of a passivation coating or anchored groups in the interface can greatly influence the growth and features of a vacuum-deposited thin film [41][42][43][44][45]. Specifically, the SiO 2 surface has been either functionalized with octadecyltrichlorosilane (OTS) as an aliphatic self-assembled monolayer (SAM) or coated with polystyrene (PS) as an aromatic polymeric layer.…”
Section: Introductionmentioning
confidence: 99%